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676

artikkel kogumikus

Testability analysis for efficient register-transfer level test generation [Electronic resource]Nõmmeots, Tanel; Raik, Jaan; Ubar, Raimund-Johannes9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 20022002 / [4] p. [CD-ROM]

artikkel kogumikus

677

artikkel kogumikus

Testability calculation for digital circuits with decision diagramsUbar, Raimund-Johannes3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers2002 / p. 137-143 : ill https://dblp.org/rec/conf/latw/Ubar02.html

artikkel kogumikus

678

artikkel kogumikus

Testability guided hierarchical test generation with decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Nõmmeots, Tanel20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 20022002 / p. 265-271 https://www.semanticscholar.org/paper/Testability-Guided-Hierarchical-Test-Generation-Ubar-Raik/c6301ac35d003c92f3867f26e2e75b87e1ad9b47

artikkel kogumikus

679

artikkel kogumikus

Testentwicklung für Mikroprozessorsystem mit Hilfe der alternativen GraphenAlango, Villem; Kont, Toomas; Ubar, Raimund-Johannes33. Internationales wissenschaftliches Kolloquium : 24.-28.10.1988. H.1.1988 / S- 11-14 https://www.ester.ee/record=b2936968*est

artikkel kogumikus

680

artikkel kogumikus

Testide genereerimine loogikalülituste alternatiivsete graafide süsteemi mudeli abilSaarma, G.; Ubar, Raimund-JohannesXXIX vabariiklik üliõpilaste teaduslik- tehniline konverents 30. märtsist - 1. aprillini 1977 : ettekannete teesid1977 / lk. 43 https://www.ester.ee/record=b2449987*est

artikkel kogumikus

681

artikkel kogumikus

Testing of systems using softwareUbar, Raimund-JohannesConcise encyclopedia of software engineering1993 / p. 352-356

artikkel kogumikus

682

artikkel kogumikus

Testing strategies for networks on chipUbar, Raimund-Johannes; Raik, JaanNetworks on chip2003 / p. 131-152 : ill https://link.springer.com/chapter/10.1007/0-306-48727-6_7

artikkel kogumikus

683

artikkel kogumikus

Testing tools for training and educationBalaž, M.; Jutman, Artur; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 12th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2005 : Krakow, Poland, 22-25 June, 2005. Vol. 1 of 22005 / p. 671-676 : ill

artikkel kogumikus

684

artikkel kogumikus

The dildis-project-using applets for more demonstrative lectures in digital systems design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichFIE 2001 : 31st Annual Frontiers in Educations Conference : Impact on Engineering and Science Education : Reno, Nevada, October 10-13, 2001 : conference program2001 / p. 83 https://ieeexplore.ieee.org/document/963996

artikkel kogumikus

685

artikkel kogumikus

The dildis-project-using applets for more demonstrative lectures in digital systems design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the 31st ASEE/IEEE Frontiers in Educations Conference : FIE'2001 : Reno, Nevada2001 / p. SIE-2-7 https://ieeexplore.ieee.org/document/963996

artikkel kogumikus

686

artikkel kogumikus

The synthesis level in Bloom's taxonomy - a nightmare for an LMSWuttke, Heinz-Dietrich; Ubar, Raimund-Johannes; Henke, Karsten; Jutman, Artur19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 199-204 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610186

artikkel kogumikus

687

artikkel kogumikus

3D parallel fault simulationGorev, Maksim; Ubar, Raimund-JohannesProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 39-42 : ill

artikkel kogumikus

688

artikkel kogumikus

Timing simulation of digital circuits with binary decision diagramsUbar, Raimund-Johannes; Jutman, Artur; Peng, Z.Design, Automation and Test in Europe : Conference and Exhibition 2001 : Munich, Germany, March 13-16, 2001 : proceedings2001 / p. 460-466 : ill https://ieeexplore.ieee.org/document/915063

artikkel kogumikus

689

artikkel kogumikus

Timing-critical path analysis with structurally synthesized BDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Jenihhin, Maksim; Raik, Jaan; Olugbenga, Niyi-Leigh; Viies, Vladimir2018 7th Mediterranean Conference on Embedded Computing (MECO)2018 / 6 p. : ill https://doi.org/10.1109/MECO.2018.8406051

artikkel kogumikus

690

artikkel ajalehes

Tippteadus ja ülikoolUbar, Raimund-JohannesMente et Manu2014 / lk. 11-15 : fot https://artiklid.elnet.ee/record=b2705056*est

artikkel ajalehes

691

artikkel kogumikus

Tippteadus ja ülikoolUbar, Raimund-JohannesTeadusmõte Eestis (VIII). Teaduskultuur : [artiklikogumik]2013 / lk. 46-53 : portr

artikkel kogumikus

692

artikkel ajalehes

Tollimaks tegi õpperaamatu hirmkalliksUbar, Raimund-JohannesEesti Päevaleht1999 / 6. dets., lk. 2

artikkel ajalehes

693

artikkel kogumikus

A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 79-82 : ill http://www.ester.ee/record=b2150914*est

artikkel kogumikus

694

artikkel kogumikus

A tool for teaching hierarchical fault diagnosis in digital circuitsUbar, Raimund-Johannes; Kostin, Sergei; Orasson, Elmet; Evartson, Teet; Brik, MarinaProceedings of 9th European Workshop on Microelectronics Education – EWME’12 : Grenoble, France, May 9-11, 20122012 / p. 1-4

artikkel kogumikus

695

artikkel kogumikus

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

artikkel kogumikus

696

artikkel kogumikus

Topological analysis of SSBDDs with applications in fault diagnosisUbar, Raimund-JohannesProceedings of 10th International Workshop on Boolean Problems : Freiberg, Germany, September 19-21, 20122012 / p. 1-16

artikkel kogumikus

697

artikkel kogumikus

Towards artificial intelligence based automatic adaptive response analyzer for high frequency analog BISTPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesCIMSA 2008 : IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : Istanbul, Turky, July 14-16, 20082008 / p. 99-104 : ill https://ieeexplore.ieee.org/document/4595841

artikkel kogumikus

698

artikkel kogumikus

Trainer 1149: a boundary scan simulation bundle for labsJutman, Artur; Ubar, Raimund-Johannes; Devadze, Sergei; Shibin, Konstantin; Rosin, VjatšeslavMIXDES 2011 : 18th International Conference "Mixed Design of Integrated Circuits and Systems" : June 16-18, 2011, Gliwice, Poland2011 / p. 520-525

artikkel kogumikus

699

artikkel ajakirjas EST / artikkel ajakirjas ENG

Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanMicroprocessors and microsystems2015 / p. 1130-1138 : ill https://doi.org/10.1016/j.micpro.2015.05.003 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

700

artikkel kogumikus

True path tracing in structurally synthesized BDDs for testability analysis of digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Oyeniran, Adeboye Stephen; Jenihhin, MaksimEuromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings2019 / p. 492-499 : ill https://doi.org/10.1109/DSD.2019.00077

artikkel kogumikus

Ubar, Raimund-Johannes (autor)

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