Otsing - TalTech teadusportaal

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reasta

451

artikkel kogumikus

Macro level defect-oriented diagnosability of digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 149-152 : ill

artikkel kogumikus

452

artikkel kogumikus

Macro level defect-oriented diagnosability of digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 53-56 : ill

artikkel kogumikus

453

artikkel kogumikus

Mapping faults in hierarchical testing of digital systemsUbar, Raimund-JohannesInternational Conference on Computer, Communication and Control Technologies CCCT'03 and the 9th International Conference on Information Systems, Analysis and Synthesis ISAS'03 : July 31 - August 1-2, Orlando, Florida, USA : proceedings. Volume I, Computing/Information Systems and Technologies2003 / p. 14-19 : ill

artikkel kogumikus

454

artikkel kogumikus

Mapping physical defects to logic level for defect oriented testingUbar, Raimund-JohannesSCS 2003 : International Symposium on Signals, Circuits and Systems : July 10-11, 2003, Iasi, Romania : proceedings. Vol. 22003 / p. 453-456 : ill https://ieeexplore.ieee.org/document/5731320

artikkel kogumikus

455

artikkel kogumikus

Measuring and identifying aging-critical paths in FPGAsPfeifer, Petr; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Pliva, ZdenekMEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France2015 / p. 56-61 : ill

artikkel kogumikus

456

artikkel kogumikus

A method for crosstalk fault detection in on-chip busesBengtsson, Tomas; Jutman, Artur; Ubar, Raimund-Johannes; Kumar, ShashiNorchip : proceedings : Oulu, Finland, 21-22 November 20052005 / p. 285-288 : ill https://doi.org/10.1109/NORCHP.2005.1597045

artikkel kogumikus

457

artikkel kogumikus

Method for testing the brainHinrikus, Hiie; Bachmann, Maie; Lass, Jaanus; Tuulik, Viiu; Ubar, Raimund-Johannes5th European Conference of the International Federation for Medical and Biological Engineering : 14-18 September 2011, Budapest, Hungary2012 / p. 1198-1201 : ill

artikkel kogumikus

458

dissertatsioon

Methods for improving the accuracy and efficiency of fault simulation in digital systems = Meetodid digitaalsüsteemide rikete simuleerimise täpsuse ja efektiivsuse tõstmiseksKõusaar, Jaak2019 https://digi.lib.ttu.ee/i/?11667

dissertatsioon

459

artikkel kogumikus

Methods for improving the performance of simulationMermet, J.; Morawiec, A.; Ubar, Raimund-JohannesAnnual report 2000 / TIMA Laboratory2001 / p. 90-94

artikkel kogumikus

460

artikkel kogumikus

Methods for improving the simulation performanceMermet, J.; Morawiec, A.; Ubar, Raimund-JohannesTechniques of Informatics and Microelectronics for Computer Architecture1999 / p. 91-94

artikkel kogumikus

461

artikkel kogumikus

Microprocessor modeling for board level test access automationDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Ubar, Raimund-JohannesProceedings of 10th IEEE Workshop on RTL and High Level Testing : Hong Kong, November 27-28, 20092009 / ? p

artikkel kogumikus

462

artikkel kogumikus

Microprocessor-based system test using debug interfaceDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Instenberg, Martin; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 98-101 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738291

artikkel kogumikus

463

artikkel ajalehes

Mida peaks teaduspoliitikas reformima? : kui hindamisel jääb puudu kompetentsusest, on bibliomeetria see faktor, mis alati kõneleb täiel häälel ja vastuvaidlematultUbar, Raimund-JohannesSirp2014 / lk. 34-35 https://www.sirp.ee/s1-artiklid/c9-sotsiaalia/mida-peaks-teaduspoliitikas-reformima/

artikkel ajalehes

464

artikkel ajakirjas

Mikroprotsessor Tehnikaülikoolist transistori 50. sünnipäevaksUbar, Raimund-JohannesHorisont1997 / 8, lk. 10-11: ill https://artiklid.elnet.ee/record=b2325971*est

artikkel ajakirjas

465

artikkel kogumikus

Minicomputer software for fault location control in digital circuitsLohuaru, Tõnu; Viilup, Agu; Ubar, Raimund-JohannesPreprints the 2nd IFAC/IFIP Symposium on Software for Computer Control, SOCOCO, Prague, Czechoslovakia, June 11-15, 1979 ; Vol. 11979 / p. [?] https://www.ester.ee/record=b2041567*est

artikkel kogumikus

466

artikkel kogumikus

Minimization of the high-level fault model for microprocessor control parts [Online resource]Ubar, Raimund-Johannes; Oyeniran, Adeboye Stephen; Medaiyese, OlusijiBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600980

artikkel kogumikus

467

artikkel ajalehes

Missioonikriitiliste sardsüsteemide arendamise nimel : [Integreeritud Elektroonikasüsteemide ja Biomeditsiinitehnika Tippkeskusest : intervjuu Raimund Ubari ja Gert Jervaniga]Ubar, Raimund-Johannes; Jervan, Gert; Ummelas, MartMente et Manu2009 / 30. jaan., lk. 1, 3 : ill ; 16. veebr., lk. 5 : ill https://www.ester.ee/record=b1242496*est

artikkel ajalehes

468

artikkel kogumikus

Mixed bottom-up/top-down hierarchical test generation for digital systemsUbar, Raimund-JohannesProceedings of the 9th European Workshop on Dependable Computing, Gdansk, Poland, May 14-16, 19981998 / p. 37-40

artikkel kogumikus

469

artikkel ajakirjas

Mixed hierarchical-functional fault models for targeting sequential coresRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi; Jenihhin, MaksimJournal of systems architecture2008 / 3/4, p. 465-477 : ill https://www.sciencedirect.com/science/article/abs/pii/S1383762107001166

artikkel ajakirjas

470

artikkel kogumikus

Mixed-level defect simulation in data-paths of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, Marina23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 617-620 : ill https://ieeexplore.ieee.org/document/1003333

artikkel kogumikus

471

artikkel kogumikus

Mixed-level deterministic-random test generation for digital systemsJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 5th International Conference on Mixed Design of Integrated Circuits and Systems, Lodz, Poland, June 18-20, 19981998 / p. 335-340

artikkel kogumikus

472

artikkel kogumikus

Mixed-level identification of fault redundancy in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, JaanLATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 20192019 / 6 p. : ill https://doi.org/10.1109/LATW.2019.8704591

artikkel kogumikus

473

artikkel ajakirjas

Mixed-level test generator for digital systemsBrik, Marina; Jervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering1997 / 4, p. 271-282 : ill

artikkel ajakirjas

474

artikkel ajakirjas EST / artikkel ajakirjas ENG

Modeling and simulation of circuits with shared structurally synthesized BDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan; Viies, VladimirMicroprocessors and microsystems2017 / p. 56-61 : ill https://doi.org/10.1016/j.micpro.2016.09.006 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

475

artikkel kogumikus

Modeling microprocessor faults on high-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, Maksim; Istenberg, Martin; Wuttke, Heinz-DietrichDSN 2008 : supplemental : 2008 IEEE International Conference on Dependable Systems & Networks With FTCS & DCC (DSN) : June 24-27, 2008, Anchorage, Alaska2008 / p. C17-C22 : ill. [CD-ROM] https://webhost.laas.fr/TSF/WDSN08/2ndWDSN08(LAAS)_files/Slides/WDSN08S-04-Ubar.pdf

artikkel kogumikus

Ubar, Raimund-Johannes (TTÜ autor)

teaviku laadid

CV 61

autor 57

tema kohta 28

märksõna 1