Otsing - TalTech teadusportaal

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reasta

476

artikkel kogumikus

Modeling sequential circuits with shared structurally synthesized BDDsUbar, Raimund-Johannes; Marenkov, Mihhail; Mironov, Dmitri; Viies, VladimirProceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 20142014 / p. 130-135 : ill

artikkel kogumikus

477

artikkel ajakirjas

Module level defect simulation in digital circuitsKuzmicz, Wieslaw; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering2001 / 4, p. 253-268

artikkel ajakirjas

478

artikkel kogumikus

Module-level fault diagnosis in combinational networksUbar, Raimund-JohannesFault-tolerant systems and diagnostics : FTSD1978 / p. 297-314

artikkel kogumikus

479

raamat

Momentvõtteid Eesti Teadusfondi 10-aastaselt teelt : [koosolekute protokollide ja ülestähenduste põhjal]Veiderma, Mihkel; Aarna, Olav; Ubar, Raimund-Johannes; Tamm, Boris, inform.2001 https://www.ester.ee/record=b1476103*est

raamat

480

artikkel kogumikus

Multi-level fault simulation of digital systems on decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaThe First IEEE International Workshop on Electronic Design, Test and Applications : DELTA 2002, 29-31 January 2002, Christchurch, New Zealand : proceedings2002 / p. 86-91 : ill

artikkel kogumikus

481

artikkel kogumikus

Multi-level test generation and fault diagnosis for finite state machinesUbar, Raimund-Johannes; Brik, MarinaDependable computing : proceedings / EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 19961996 / p. 264-281: ill

artikkel kogumikus

482

raamat

Multi-level test generation and fault diagnosis in digital systemsUbar, Raimund-Johannes1992

raamat

483

artikkel kogumikus

Multi-level test generation for digital systems at system, circuit and defect levelsUbar, Raimund-JohannesProceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 20012001 / p. 286-288

artikkel kogumikus

484

artikkel kogumikus

Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

artikkel kogumikus

485

artikkel kogumikus

Multiple fault analyses in logic circuitsUbar, Raimund-JohannesIFAC-Symposium Discrete Systems : Dresden, 14.-19. 3. 771977 / p. [?]

artikkel kogumikus

486

artikkel kogumikus

Multiple fault diagnosis with BDD based Boolean differential equationsUbar, Raimund-Johannes; Raik, Jaan; Kostin, Sergei; Kõusaar, JaakBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 77-80 : ill

artikkel kogumikus

487

artikkel kogumikus

Multiple fault testing in systems-on-chip with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen; Schölzel, Mario; Vierhaus, Heinrich TheodorProceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 20152015 / p. 66-71 : ill http://dx.doi.org/10.1109/IDT.2015.7396738

artikkel kogumikus

488

artikkel kogumikus

Multiple stuck-at-fault detection theoremUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 / p. 236-241 : ill

artikkel kogumikus

489

artikkel kogumikus

Multi-valued simulation of digital circuitsUbar, Raimund-JohannesProceedings : 1997 21st International Conference on Microelectronics : Niš, Yugoslavia, 14-17 September 1997. Vol. 21997 / p. 721-724 : ill

artikkel kogumikus

490

artikkel kogumikus

Multi-valued simulation of digital circuits with structurally synthesized binary decision diagramsUbar, Raimund-JohannesMultiple valued logic. Vol. 41998 / p. 141-157

artikkel kogumikus

491

artikkel kogumikus

Multivalued simulation on AG-model of digital devicesUbar, Raimund-Johannes; Voolaine, AndrusProceedings of the 12th Conference on Fault-Tolerant Systems and Diagnostics, Prague, Czechoslovakia, September, 19891989 / p. 101-104

artikkel kogumikus

492

artikkel kogumikus

Multi-valued simulation with binary decision diagramsUbar, Raimund-Johannes; Raik, JaanProceedings IEEE European Test Workshop, Cagliari, Italy, May 28-30, 19971997 / p. 28-29

artikkel kogumikus

493

artikkel kogumikus

Mutation analysis for systemC designs at TLMGuarnieri, Valerio; Bombieri, Nicola; Pravadelli, Graziano; Fummi, Franco; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 20112011 / [6] p https://ieeexplore.ieee.org/document/5985925

artikkel kogumikus

494

artikkel kogumikus

Mutation analysis with high-level decision diagramsHantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Tšepurov, Anton; Ubar, Raimund-Johannes; Guglielmo, Giuseppe di; Fummi, FrancoLATW2010 : 11th Latin-American TestWorkshop, March 28-31, 2010, Punta del Este, Uruguay2010 / [6] p. [CD-ROM] https://ieeexplore.ieee.org/document/5550336

artikkel kogumikus

495

artikkel ajalehes

Mõtted TTÜ arengukava koostamise puhulUbar, Raimund-JohannesTehnikaülikool1999 / 17. mai, lk. 5-8 https://www.ester.ee/record=b5309277*est

artikkel ajalehes

496

artikkel ajalehes

Mõtteid koostöö võimalikkusest Ida-Lääne piirilUbar, Raimund-Johannes; Kruus, MargusMente et Manu2003 / 20. okt., lk. 2 : portr https://artiklid.elnet.ee/record=b1415646*est

artikkel ajalehes

497

artikkel kogumikus

Mõtteid kõrgharidus- ja teaduspoliitilisest olukorrast EestisUbar, Raimund-JohannesEesti Teaduste Akadeemia aastaraamat 20002001 / lk. 135-139

artikkel kogumikus

498

artikkel kogumikus

Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensorsUbar, Raimund-Johannes; Vargas, Fabian; Jenihhin, Maksim; Raik, JaanMEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 20132013 / [1] p

artikkel kogumikus

499

artikkel kogumikus

New built-in self-test scheme for SoC interconnectJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanThe 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV2005 / p. 19-24 : ill https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect

artikkel kogumikus

500

artikkel kogumikus

New categories of Safe Faults in a processor-based Embedded SystemGürsoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Adeboye Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund-Johannes2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 4 p. : ill https://doi.org/10.1109/DDECS.2019.8724642

artikkel kogumikus

Ubar, Raimund-Johannes (TTÜ autor)

teaviku laadid

CV 63

autor 57

tema kohta 28

märksõna 1