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5326

artikkel kogumikus

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings2000 / p. 69-74 : ill https://ieeexplore.ieee.org/document/873781

artikkel kogumikus

5327

artikkel kogumikus

Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patternsUbar, Raimund-Johannes; Jutman, ArturProceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 19991999 / p. 437-442 : ill https://www.sciencedirect.com/science/article/pii/S0026271499002036

artikkel kogumikus

5328

artikkel kogumikus

A hierarchical Dirichlet process model for joint part-of-speech and morphology inductionSirts, Kairit; Alumäe, TanelNAACL HLT 2012 : the 2012 Conference of the North American Chapter of the Association for Computational Linguistics : Human Language Technologies : proceedings of the conference : June 3-8, 2012, Montreal, Canada2012 / p. 407-416 : ill https://www.researchgate.net/publication/262277910_A_hierarchical_Dirichlet_process_model_for_joint_part-of-speech_and_morphology_induction

artikkel kogumikus

5329

artikkel kogumikus

Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Evartson, Teet; Lensen, Harri; Aarna, Margit5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada2007 / [6] p. [CD-ROM]

artikkel kogumikus

5330

artikkel kogumikus

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

artikkel kogumikus

5331

artikkel kogumikus

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

artikkel kogumikus

5332

artikkel kogumikus

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

artikkel kogumikus

5333

artikkel kogumikus

Hierarchical language for development of distributed algorithmsKaldma, TarmoProceedings of the Fourth Symposium on Programming Languages and Software Tools, Visegrad, Hungary, June 9-10, 19951995 / p. 195-208

artikkel kogumikus

5334

artikkel kogumikus

Hierarchical test generation based on alternative graph modelUbar, Raimund-JohannesProceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 19951995 / p. 18

artikkel kogumikus

5335

artikkel ajakirjas

Hierarchical test generation for combinational circuits with real defects coverageCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2002 / p. 1141-1149 : ill https://www.sciencedirect.com/science/article/pii/S002627140200080X

artikkel ajakirjas

5336

artikkel kogumikus

Hierarchical test generation for complex digital systems with control and data processing partsUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 43-52

artikkel kogumikus

5337

artikkel kogumikus

Hierarchical test generation for digital systemsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 131-136: ill https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_20

artikkel kogumikus

5338

artikkel kogumikus

Hierarchical test generation for digital systems based on combining bottom-up and top-down approachesRaik, Jaan; Ubar, Raimund-JohannesWorld Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 11998 / p. 374-381: ill

artikkel kogumikus

5339

artikkel kogumikus

Hierarchical test generation with multi-level decision diagram modelsJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 19981998 / p. 26-33 https://www.academia.edu/67811738/Hierarchical_Test_Generation_with_Multi_Level_Decision_Diagram_Models?hb-g-sw=7883185

artikkel kogumikus

5340

artikkel kogumikus

Hierarchical test generation. SEMI show slidesUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 53-64

artikkel kogumikus

5341

artikkel kogumikus

Hierarchical test synthesis for digital systems using alternative graph modelUbar, Raimund-JohannesQuantitative aspects of designing and validating dependable computing systems1995

artikkel kogumikus

5342

artikkel kogumikus

High definition gelling agent from the local seaweedFriedenthal, Margus; Sirendi, Meelis; Vokk, Raivo; Köster, M.Jordbruk og samfunn : kongresrapport : NJF XXI kongress, As, 28. juni - 1. juli, 19991999 / p. 180

artikkel kogumikus

5343

artikkel kogumikus

High efficient photovoltaics in EstoniaAltosaar, Mare; Bereznev, Sergei; Kauk, Marit; Krunks, Malle; Krustok, Jüri; Mellikov, Enn; Raudoja, Jaan; Varema, TiitProc. 3rd Workshop held at JRC Ispra, 2-3 Oct. 20032004 / p. 179-190

artikkel kogumikus

5344

artikkel kogumikus

High frequency intrinsic localized modes in solids: an example of metallic NiHižnjakov, Vladimir; Haas, Mati; Klopov, Mihhail; Šelkan, AleksanderBook of abstracts. Programme : 3rd Bilateral Estonian-German Workshop “Strong Nonlinear Vibronic and Electronic Interactions in Solids” : Cottbus, Germany, June 13-15, 20112011 / p. 39

artikkel kogumikus

5345

artikkel kogumikus

High level fault modeling in digital systemsUbar, Raimund-Johannes; Aarna, Margit; Brik, Marina; Raik, JaanSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 486-491

artikkel kogumikus

5346

artikkel kogumikus

High order iterative methods for decomposition-coordination problemsVaarmann, OtuWorkshop of the European Working Group on Metaheuristics "Metaheuristics and Large Scale Optimization"2005 / p. 15 https://www.tandfonline.com/doi/abs/10.1080/13928619.2006.9637723

artikkel kogumikus

5347

artikkel ajakirjas

High order iterative methods for decomposition-coordination problemsVaarmann, OtuTechnological and economic development of economy2005 / 4, p. 6 https://www.tandfonline.com/doi/abs/10.1080/13928619.2006.9637723

artikkel ajakirjas

5348

artikkel ajakirjas

High order iterative methods for decomposition-coordination problemsVaarmann, OtuTechnological and economic development of economy2006 / 1, p. 56-61

artikkel ajakirjas

5349

artikkel kogumikus

High order iterative methods for problems in mathematical modellingVaarmann, OtuThe Third International Conference : Tools for Mathematical Modelling : June 18-23, Saint-Petersburg : book of abstracts2001 / p. 58

artikkel kogumikus

5350

artikkel kogumikus

High order iterative methods for problems in mathematical modellingVaarmann, OtuTools for mathematical modelling2001 / p. 161-168

artikkel kogumikus

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