Otsing - TalTech teadusportaal

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26

artikkel kogumikus

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

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27

artikkel kogumikus

Defect-oriented test generation using probabilistic estimationCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 131-136 : ill

artikkel kogumikus

28

artikkel kogumikus

Defects in CdTe-based photodetectorsValdna, VelloMaterials Research Society Symposia proceedings series2000 / p. 241-246 : ill

artikkel kogumikus

29

artikkel kogumikus

Defects in chlorine doped CdTe thin filmsValdna, Vello; Hiie, Jaan; Gavrilov, AlekseiAbstracts POLYSE2000 / p. 36

artikkel kogumikus

30

artikkel ajakirjas

Defects in chlorine-doped CdTe thin filmsValdna, Vello; Hiie, Jaan; Gavrilov, AlekseiSolid state phenomena2001 / p. 155-160 : ill

artikkel ajakirjas

31

raamat

Defektide ja rikete seoste analüüs : lepingu Lep16039 aruanne [Võrguväljaanne]Palu, Ivo; Keel, Matti; Tammoja, Heiki2016 https://www.elektrilevi.ee/-/doc/6305157/ettevottest/defektide_rikete_aruanne.pdf

raamat

32

artikkel kogumikus

Defektide tasakaalu kinnikülmutamise arvutamine tsinksulfiidisLott, Kalju; Türn, LeoXXIII Eesti keemiapäevad : teaduskonverentsi ettekannete referaadid1997 / lk. 71

artikkel kogumikus

33

artikkel ajakirjas

Dependence of the friction coefficient on roughness parameters during early stage fretting of (Al,Ti)N coated surfacesPodgurski, Vitali; Adoberg, Eron; Surženkov, Andrei; Kimmari, Eduard; Viljus, Mart; Mikli, Valdek; Hartelt, M.; Wäsche, R.; Šima, M.; Kulu, PriitWear2011 / p. 853-858 : ill https://www.sciencedirect.com/science/article/abs/pii/S0043164811001815

artikkel ajakirjas

34

artikkel ajakirjas

Detection of axial cracks in pipes using focused guided wavesFletcher, Sam; Lowe, Michael John Stewart; Ratassepp, Madis; Brett, ColinJournal of nondestructive evaluation2012 / p. 56-64 : ill https://www.researchgate.net/publication/234956324_Detection_of_Axial_Cracks_in_Pipes_Using_Focused_Guided_Waves

artikkel ajakirjas

35

artikkel kogumikus

Diffusion acoustique d'un moyeu et d'une paleCite, Nicolas; Chati, Farid; Leon, Fernand; Maze, Gerard; Naar, Hendrik; Klauson, Aleksander10eme Congres Francais d'Acoustique : Lyon, 12-16 Avril 20102010 / [5] p. : ill https://theses.hal.science/CFA2010-APU12/hal-00537192v1

artikkel kogumikus

36

dissertatsioon

Doping and defect thermodynamic equilibrium in ZnSLott, Kalju2000 http://www.ester.ee/record=b1316491*est

dissertatsioon

37

artikkel ajakirjas

Effects of long-range forces in nonlinear dynamics of crystals : creation of defects and self-localized vibrationsHaas, Mati; Hižnjakov, Vladimir; Klopov, Mihhail; Shelkan, A.IOP conference series : materials science and engineering2010 / 1, p. 01245 : ill https://iopscience.iop.org/article/10.1088/1757-899X/15/1/012045

artikkel ajakirjas

38

artikkel ajakirjas

Elastic models of defects in two-dimensional crystalsKolesnikova, Anna; Orlova, T.; Hussainova, Irina; Romanov, AlexeyPhysics of the solid state2014 / p. 2573-2579 : ill

artikkel ajakirjas

39

artikkel ajakirjas EST / artikkel ajakirjas ENG

Extended defects in ZnO : efficient sinks for point defectsAzarov, Alexander; Rauwel, Protima; Hallen, Anders; Monakhov, Edouard; Svensson, Bengt G.Applied physics letters2017 / p. 022103-1 - 022103-5 : ill https://doi.org/10.1063/1.4973463 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

40

artikkel kogumikus

Failure times of gypsum boardsJust, Alar; Schmid, Joachim; König, J.Structures in Fire : proceedings of the 6th International Conference (SiF'10) : June 2-4, 2010, East Lansing, MI2010 / p. 593-601

artikkel kogumikus

41

artikkel kogumikus

Fatigue strength prediction of carbide composites by considering pores to be equivalent to small defects : effect of hot isostatic pressingSergejev, Fjodor; Preis, Irina; Kübarsepp, JakobBook of abstracts : International Symposium on Fatigue Design and Material Defects : Trondheim, Norway, 23-25 May 20112011 / p. 41-42

artikkel kogumikus

42

artikkel ajakirjas EST / artikkel ajakirjas ENG

Generation and development of damage in double forged tungsten in different combined regimes of irradiation with extreme heat loadsPaju, Jana; Väli, Berit; Laas, Tõnu; Shirokova, Veroonika; Antonov, MaksimJournal of nuclear materials2017 / p. 91-102 : ill https://doi.org/10.1016/j.jnucmat.2017.07.042 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

43

artikkel kogumikus

Hierarchical analysis of short defects between metal lines in CMOS ICPleskacz, Witold A.; Jenihhin, Maksim; Raik, Jaan; Rakowski, Michal; Ubar, Raimund-Johannes; Kuzmicz, WieslawProceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy2008 / p. 729-734 : ill https://ieeexplore.ieee.org/document/4669309

artikkel kogumikus

44

artikkel kogumikus

Hierarchical defect level test quality analysisBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

artikkel kogumikus

45

artikkel kogumikus

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 151-156 https://ieeexplore.ieee.org/document/873781

artikkel kogumikus

46

artikkel ajakirjas

Hierarchical physical defect reasoning in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Brik, MarinaEstonian journal of engineering2011 / 3, p. 185-200

artikkel ajakirjas

47

artikkel ajakirjas

Hierarchical test generation for combinational circuits with real defects coverageCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2002 / p. 1141-1149 : ill https://www.sciencedirect.com/science/article/pii/S002627140200080X

artikkel ajakirjas

48

artikkel ajakirjas

High temperature antistructure disorder in undoped ZnSLott, Kalju; Šinkarenko, Svetlana; Türn, Leo; Nirk, Tiit; Öpik, Andres; Kallavus, Urve; Gorokhova, Elena; Grebennik, A.; Vishnjakov, A.Physica B : condensed matter2009 / 23/24, p. 5006-5008 : ill https://www.sciencedirect.com/science/article/pii/S0921452609009910

artikkel ajakirjas

49

artikkel ajakirjas

High temperature defect equilibrium in ZnS:Cu single crystalsLott, Kalju; Šinkarenko, Svetlana; Türn, Leo; Nirk, Tiit; Öpik, Andres; Kallavus, Urve; Gorokhova, Elena; Grebennik, A.; Vishnjakov, A.Physica status solidi (b)2010 / 7, p. 1662-1665

artikkel ajakirjas

50

artikkel ajakirjas

High temperature investigation of ZnS:Ga and CdSe:GaLott, Kalju; Nirk, Tiit; Volobujeva, Olga; Šinkarenko, Svetlana; Türn, Leo; Kallavus, Urve; Grebennik, A.; Vishnjakov, A.Physica B2006 / Proceedings of the 23rd International Conference on Defects in Semiconductors : ICDS-23 : held in Awaji Island, Japan, 24-29 July, 2005. p. 764-766 : ill https://www.sciencedirect.com/science/article/pii/S0921452605015796

artikkel ajakirjas

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