Otsing - TalTech teadusportaal

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1126

artikkel kogumikus

High-frequency split-bobbin transformer design with adjustable leakage inductanceRahman, Showrov; Sidorov, Vadim; Chub, Andrii; Vinnikov, Dmitri2021 IEEE 62nd International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), 15-17 Nov. 2021 : conference proceedings2021 / p. 1-5 : ill https://doi.org/10.1109/RTUCON53541.2021.9711708

artikkel kogumikus

Seotud publikatsioonid 1

Universal galvanically isolated DC-DC converters with topology morphing control = Universaalsed topoloogiat muutva juhtimisega galvaaniliselt isoleeritud alalispingemuundurid

1127

artikkel kogumikus

High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

artikkel kogumikus

1128

artikkel kogumikus

High-level combined deterministic and pseudo-exhuastive test generation for RISC processorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

artikkel kogumikus

1129

artikkel kogumikus

High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

artikkel kogumikus

1130

artikkel kogumikus

High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

artikkel kogumikus

1131

artikkel kogumikus

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

artikkel kogumikus

1132

artikkel kogumikus

High-level intellectual property obfuscation via decoy constantsAksoy, Levent; Nguyen, Quang-Linh; Almeida, Felipe; Raik, Jaan; Flottes, Marie-Lise; Dupuis, Sophie; Pagliarini, Samuel Nascimento2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) : Torino, Italy, 28-30 June 20212021 / p. 1-7 https://doi.org/10.1109/IOLTS52814.2021.9486714

artikkel kogumikus

1133

artikkel kogumikus

High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445

artikkel kogumikus

1134

artikkel kogumikus

High-level synthesis of control and memory intensive communication systemsEllervee, PeeterEighth Annual IEEE International ASIC Conference and Exhibit : proceedings : Stouffer Renaissance Austin Hotel, Austin, Texas, September 18-22, 19951995 / p. 185-191 : ill

artikkel kogumikus

1135

artikkel kogumikus

High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167

artikkel kogumikus

1136

artikkel kogumikus

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

artikkel kogumikus

1137

artikkel kogumikus

High-level test synthesis with hierarchical test generationJervan, Gert; Eles, Petru; Peng, Zebo; Raik, Jaan; Ubar, Raimund-Johannes17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings1999 / p. 291-296

artikkel kogumikus

1138

artikkel ajakirjas EST / artikkel ajakirjas ENG

High-performance buck-boost partial power quasi-Z-source series resonance converterAbdelrahim Abdelghafour, Omar Mohamed; Chub, Andrii; Mashinchi Maheri, Hamed; Blinov, Andrei; Vinnikov, DmitriIEEE Access2022 / p. 13017-130189 https://doi.org/10.1109/ACCESS.2022.3225751 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

1139

artikkel kogumikus

High-performance hardware accelerators for sorting and managing prioritiesSklyarov, Valery; Skliarova, Iouliia; Mihhailov, Dmitri; Sudnitsõn, AleksanderProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 313-318 : ill https://ieeexplore.ieee.org/document/5783103

artikkel kogumikus

1140

artikkel kogumikus

A High-performance open-source finite element analysis library for magnetics in MATLABLehikoinen, Antti; Davidsson, T.; Arkkio, Antero; Belahcen, Anouar2018 XIII International Conference on Electrical Machines (ICEM 2018) : Alexandroupoli, Greece, 3-6 September 20182018 / p. 486–492 : ill http://doi.org/10.1109/ICELMACH.2018.8507235

artikkel kogumikus

1141

artikkel ajakirjas EST / artikkel ajakirjas ENG

High-performance quasi-Z-source series resonant DC-DC converter for photovoltaic module-level power electronics applicationsVinnikov, Dmitri; Chub, Andrii; Liivik, Elizaveta; Roasto, IndrekIEEE transactions on power electronics2017 / p. 3634-3650 : ill https://doi.org/10.1109/TPEL.2016.2591726 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

1142

artikkel ajakirjas

High-speed design of postquantum cryptography with optimized hashing and multiplicationImran, Malik; Aikata, Aikata; Roy, Sujoy Sinha; Pagliarini, Samuel NascimentoIEEE Transactions on Circuits and Systems II : Express Briefs2023 / p. 847-851 : ill https://doi.org//10.1109/TCSII.2023.3273821

artikkel ajakirjas

Seotud publikatsioonid 1

Hardware realization of lattice-based post-quantum cryptography = Võrel põhinev post-kvant-krüptograafia riistvaraline realisatsioon

1143

artikkel kogumikus

High-voltage auxiliary power supply with the simplified power circuit topology for the DC trains [Electronic resource]Vinnikov, Dmitri; Laugis, JuhanProceedings of the 9th International Conference "Electrical Power Quality and Utilisation" : EPQU'2007 : Barcelona, Spain, October 9-11, 20072007 / [6] p. [CD-ROM] https://ieeexplore.ieee.org/document/4424227

artikkel kogumikus

1144

artikkel kogumikus

Higuchi fractal dimension and spectral entropy as measures of depth of sedation in intensive care unitAnier, Andres; Lipping, Tarmo; Melto, S.; Hovilehto, S.Proceedings of the 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society : San Francisco, CA, USA, September 1-5, 2004. Vol. 12004 / p. 526-529 : ill https://pubmed.ncbi.nlm.nih.gov/17271729/

artikkel kogumikus

1145

artikkel kogumikus

Hilbert transform, an effective replacement of Park's vector modulus for the detection of rotor faultsAsad, Bilal; Vaimann, Toomas; Kallaste, Ants; Rassõlkin, Anton; Belahcen, Anouar2019 Electric Power Quality and Supply Reliability Conference (PQ) & 2019 Symposium on Electrical Engineering and Mechatronics (SEEM), Kärdla, Estonia, June 12-15, 2019 : proceedings2019 / 4 p. : ill https://doi.org/10.1109/PQ.2019.8818227

artikkel kogumikus

1146

artikkel kogumikus

HLS-based optimization of tau triggering algorithm for LHC: a case studyCherezova, Natalia; Mihhailov, Dmitri; Devadze, Sergei; Jutman, Artur2022 18th Biennial Baltic Electronics Conference (BEC)2022 / 6 p. : ill https://doi.org/10.1109/BEC56180.2022.9935599

artikkel kogumikus

1147

artikkel ajakirjas EST / artikkel ajakirjas ENG

Holistic cyber-physical approach for the performance evaluation of communication and control systems in DC microgridsVéliz, Antonio; Contreras, René; Riffo, Sebastián; Restrepo, Carlos; Garcés-Ruiz, Alejandro; Chub, Andrii; González-Castaño, Catalina; Flores-Bahamonde, FreddyIEEE journal of emerging and selected topics in power electronics2025 https://doi.org/10.1109/JESTPE.2025.3564851 https://ieeexplore.ieee.org/document/10977842

artikkel ajakirjas EST / artikkel ajakirjas ENG

1148

artikkel kogumikus

A holistic D-PMU optimal placement framework considering pragmatic constraints in smart gridsFarhizadan, Mohammadreza; Karrari, Mehdi; Gharehpetian, Gevork B.; Ahmadiahangar, Roya; Kilter, Jako; Rosin, ArgoIEEE 16th International Conference on Compatibility, Power Electronics, and Power Engineering (CPE-POWERENG)2022 / 7 p. https://doi.org/10.1109/CPE-POWERENG54966.2022.9880881

artikkel kogumikus

1149

artikkel ajakirjas EST / artikkel ajakirjas ENG

Home energy management systems: A review of the concept, architecture, and scheduling strategiesHan, Binghui; Zahraoui, Younes; Mubin, Marizan; Mekhilef, Saad; Seyedmahmoudian, Mehdi; Stojcevski, AlexIEEE Access2023 / p. 19999-20025 https://doi.org/10.1109/ACCESS.2023.3248502 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

1150

artikkel kogumikus

How much is too much - equilibrium points for good export and R&D intensity : data of world top 2000 companiesRungi, Mait; Ida, AndresIEEM 2015 : 2015 IEEE International Conference on Industrial Engineering and Engineering Management : 6-9 December 2015, Singapore2015 / p. 1556-1560 : tab http://dx.doi.org/10.1109/IEEM.2015.7385908

artikkel kogumikus

IEEE (kirjastus/väljaandja)

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