Otsing - TalTech teadusportaal

kuva

reasta

1126

artikkel kogumikus

A hierarchical approach for devising area efficient concurrent online checkersNiazmand, Behrad; Azad, Siavoosh Payandeh; Ghasempouri, Tara; Raik, Jaan; Jervan, GertProceedings 2nd IEEE International Test Conference in Asia : ITC-Asia 2018, 15-17 August 2018, Harbin, China2018 / p. 139-144 : ill https://doi.org/10.1109/ITC-Asia.2018.00034

artikkel kogumikus

1127

artikkel kogumikus

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

artikkel kogumikus

1128

artikkel kogumikus

Hierarchical regions of interestJärv, Priit; Tammet, Tanel; Tall, Marten2018 IEEE 19th International Conference on Mobile Data Management : MDM 2018, 26–28 June 2018, Aalborg University, Denmark : proceedings2018 / p. 86-95 https://doi.org/10.1109/MDM.2018.00025

artikkel kogumikus

1129

artikkel kogumikus

Hierarchical temporal memory implementation on FPGA using LFSR based spatial poolerKerner, Madis; Tammemäe, KalleProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 92-95 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

artikkel kogumikus

1130

artikkel kogumikus

Hierarchical timing-critical paths analysis in sequential circuitsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Kostin, Sergei2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain2018 / 6 p. : ill https://doi.org/10.1109/PATMOS.2018.8464176

artikkel kogumikus

1131

artikkel ajakirjas EST / artikkel ajakirjas ENG

High gain DC-AC high-frequency link inverter with improved quasi-resonant modulationBlinov, Andrei; Korkh, Oleksandr; Chub, Andrii; Vinnikov, Dmitri; Peftitsis, Dimosthenis; Norrga, Staffan; Galkin, IljaIEEE transactions on industrial electronics2022 / p. 1465-1476 : ill https://doi.org/10.1109/TIE.2021.3060657 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

1132

artikkel kogumikus

High speed data preprocessing for bioimpedance measurements : architectural explorationEllervee, Peeter; Annus, Paul; Min, MartThe 27th NORCHIP Conference : Trondheim, Norway, November 20092009 / [4] p https://ieeexplore.ieee.org/document/5397838

artikkel kogumikus

1133

artikkel ajakirjas EST / artikkel ajakirjas ENG

A high step-up non-isolated dc-dc converter with low voltage stress across transistorPourjafar, Saeed; Hemmati Shahsavar, Tala; Hashemzadeh, Seyed Majid; Husev, Oleksandr; Matiushkin, Oleksandr; Vinnikov, DmitriIEEE transactions on industrial electronics2024 / p. 15755-15767 https://doi.org/10.1109/TIE.2024.3383025 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

1134

artikkel kogumikus

High voltage circuit breaker charging motor’s condition monitoring - importance, possibilities, and challengesAsad, Bilal; Sardar, Muhammad Usman; Vaimann, Toomas; Kallaste, Ants; Asefi, Sajjad; Kilter, Jako2024 International Conference on Diagnostics in Electrical Engineering (Diagnostika)2024 / 7 p https://doi.org/10.1109/Diagnostika61830.2024.10693906

artikkel kogumikus

1135

artikkel kogumikus

High voltage circuit breaker health index Evaluation considering measurement accuracyAsefi, Sajjad; Kilter, Jako; Shayesteh, Ebrahim; Hilber, Patrik; Lindquist, TommieIEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT Europe 2024) : proceedings2024 / 5 p https://doi.org/10.1109/ISGTEUROPE62998.2024.10863019

artikkel kogumikus

1136

artikkel kogumikus

High voltage GaAs diode stacks : the choice of epistructures for assemblingRang, Toomas; Voitovitš, Viktor; Kuznetsova, NataljaDesign, Test, Integration and Packaging of MEMS/MOEMS - DTIP2004 : 12-14 May 2004, Montreux, Switzerland2004 / p. 199-202 : ill

artikkel kogumikus

1137

artikkel kogumikus

High-accuracy eddy current measurements of metalsMärtens, Olev; Land, Raul; Rist, Marek; Pokatilov, Andrei2014 IEEE International Workshop On Metrology For Aerospace : May 29-30, 2014, Benevento, Italy : proceedings2014 / p. 155-160 : ill

artikkel kogumikus

1138

artikkel ajakirjas EST / artikkel ajakirjas ENG

High-efficiency partial power converter for integration of second-life battery energy storage systems in DC microgridsHassanpour, Naser; Chub, Andrii; Yadav, Neelesh; Blinov, Andrei; Vinnikov, DmitriIEEE Open Journal of the Industrial Electronics Society2024 / p. 847-860 https://doi.org/10.1109/OJIES.2024.3389466 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

Seotud publikatsioonid 1

Design and Control of Bidirectional Step-Up/Down Partial Power Converters for DC Microgrid Applications = Alalisvoolu mikrovõrkudele osavõimsuse töötlusega kahesuunalise tõste-langetusmuunduri projekteerimine ja juhtimine

1139

artikkel ajakirjas EST / artikkel ajakirjas ENG

High-efficiency quad-mode parallel PV power optimizer for DC microgridsSidorov, Vadim; Chub, Andrii; Vinnikov, DmitriIEEE transactions on industry applications2023 / p. 1002-1012 https://doi.org/10.1109/TIA.2022.3208879 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

1140

artikkel ajakirjas EST / artikkel ajakirjas ENG

High-efficiency single-stage onboard charger for electrical vehiclesZinchenko, Denys; Blinov, Andrei; Chub, Andrii; Vinnikov, Dmitri; Verbytskyi, Ievgen; Bayhan, SertacIEEE Transactions on Vehicular Technology2021 / p. 12581-12592 : ill https://doi.org/10.1109/TVT.2021.3118392 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

1141

artikkel kogumikus EST / artikkel kogumikus ENG

High-efficient switched-capacitor step-up DC–DC converter with partial power processingToebe, Ademir; Bulegon Löbler, Pedro Henrique; Dos Santos, Niwton Gabriel Feliciani; Beltrame, Rafael Concatto; Schuch, Luciano; Rech, CassianoIECON 2025 – 51st Annual Conference of the IEEE Industrial Electronics Society2025 / 6 p https://doi.org/10.1109/IECON58223.2025.11221931

artikkel kogumikus EST / artikkel kogumikus ENG

1142

artikkel kogumikus EST / artikkel kogumikus ENG

Higher-dimensional subdiagram matchingHadzihasanovic, Amar; Kessler, Diana-Maria2023 38th Annual ACM/IEEE Symposium on Logic in Computer Science (LICS) : Boston, MA, USA : 26-29 June 20232023 / 13 p https://doi.org/10.1109/LICS56636.2023.10175726 Conference Proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

Seotud publikatsioonid 1

Computational aspects of rewriting in higher-dimensional diagrams = Kõrgemamõõtmeliste diagrammide ümberkirjutamise arvutuslikud aspektid

1143

artikkel kogumikus

High-frequency split-bobbin transformer design with adjustable leakage inductanceRahman, Showrov; Sidorov, Vadim; Chub, Andrii; Vinnikov, Dmitri2021 IEEE 62nd International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), 15-17 Nov. 2021 : conference proceedings2021 / p. 1-5 : ill https://doi.org/10.1109/RTUCON53541.2021.9711708

artikkel kogumikus

Seotud publikatsioonid 1

Universal galvanically isolated DC-DC converters with topology morphing control = Universaalsed topoloogiat muutva juhtimisega galvaaniliselt isoleeritud alalispingemuundurid

1144

artikkel kogumikus

High-level combined deterministic and pseudo-exhuastive test generation for RISC processorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

artikkel kogumikus

1145

artikkel kogumikus

High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

artikkel kogumikus

1146

artikkel kogumikus

High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

artikkel kogumikus

1147

artikkel kogumikus

High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

artikkel kogumikus

1148

artikkel kogumikus

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

artikkel kogumikus

1149

artikkel kogumikus

High-level intellectual property obfuscation via decoy constantsAksoy, Levent; Nguyen, Quang-Linh; Almeida, Felipe; Raik, Jaan; Flottes, Marie-Lise; Dupuis, Sophie; Pagliarini, Samuel Nascimento2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) : Torino, Italy, 28-30 June 20212021 / p. 1-7 https://doi.org/10.1109/IOLTS52814.2021.9486714

artikkel kogumikus

1150

artikkel kogumikus

High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445

artikkel kogumikus

IEEE (kirjastus/väljaandja)

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