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76

artikkel kogumikus

Functional test program generation for digital systemsUbar, Raimund-Johannes; Dušina, Julia; Krupnova, Helena; Storožev, Sergei; Zaugarov, ViktorTestmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 19941994 / p. 14-18: ill

artikkel kogumikus

77

artikkel kogumikus

GA-based test generation for sequential circuitsBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 30-34

artikkel kogumikus

78

artikkel kogumikus

A general approach to synthesis of the finite-state machine logical structure in the sum-of-products formChapenko, V.; Fritsnovich, G.; Kalnberzin, A.; Lange, E.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 385-390 https://www.ester.ee/record=b2150914*est

artikkel kogumikus

79

artikkel kogumikus

Genetic algorithm approach to the problem of finite state machine constructionSpitšakova, MargaritaInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 69-72 : ill

artikkel kogumikus

80

raamat

Guide to the digital switchoverNyman-Metcalf, Katrin Merike; Richter, Andrei2010 https://www.osce.org/files/f/documents/8/c/73720.pdf

raamat

81

artikkel kogumikus

Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Evartson, Teet; Lensen, Harri; Aarna, Margit5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada2007 / [6] p. [CD-ROM]

artikkel kogumikus

82

artikkel kogumikus

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

artikkel kogumikus

83

artikkel kogumikus

Hierarchical test generation for complex digital systems with control and data processing partsUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 43-52

artikkel kogumikus

84

artikkel kogumikus

Hierarchical test generation. SEMI show slidesUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 53-64

artikkel kogumikus

85

artikkel kogumikus

Hierarchical test synthesis for digital systems using alternative graph modelUbar, Raimund-JohannesQuantitative aspects of designing and validating dependable computing systems1995

artikkel kogumikus

86

artikkel kogumikus

High level fault modeling in digital systemsUbar, Raimund-Johannes; Aarna, Margit; Brik, Marina; Raik, JaanSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 486-491

artikkel kogumikus

87

artikkel ajakirjas

High quality test generation for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, JaanRomanian journal of information science and technology2005 / 1, p. 73-84 : ill

artikkel ajakirjas

88

artikkel kogumikus

High-Level Decision Diagram manipulations for code coverage analysisMinakova, Karina; Reinsalu, Uljana; Tšepurov, Anton; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 207-210 : ill

artikkel kogumikus

89

artikkel kogumikus

High-level synthesis and test in the MOSCITO-based virtual laboratorySchneider, Andre; Diener, Karl-Heinz; Jervan, Gert; Peng, Z.; Raik, Jaan; Ubar, Raimund-Johannes; Hollstein, Thomas; Glesner, M.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 287-290 : ill

artikkel kogumikus

90

artikkel kogumikus

How to generate high quality tests for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, Jaan2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 22004 / p. 459-462 : ill http://dx.doi.org/10.1109/SMICND.2004.1403048

artikkel kogumikus

91

artikkel kogumikus

Hybrid BIST optimization for core-based systems with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboDELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : 28-30 January 2004, Perth, Australia : proceedings2004 / p. 3-8 : ill https://ieeexplore.ieee.org/document/1409808

artikkel kogumikus

92

artikkel kogumikus

Hybrid functional BIST for digital systemsMazurova, Natalja; Smahtina, Julia; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 205-208 : ill

artikkel kogumikus

93

artikkel ajakirjas EST / artikkel ajakirjas ENG

Implementation of Digital Twins for electrical energy conversion systems in selected case studiesRassõlkin, Anton; Orosz, Tamas; Demidova, Galina; Kuts, Vladimir; Rjabtšikov, Viktor; Vaimann, Toomas; Kallaste, AntsProceedings of the Estonian Academy of Sciences2021 / p. 19-39 : ill https://doi.org/10.3176/proc.2021.1.03 https://doi.org/wp-content/plugins/kirj/pub/proc-1-2021-19-39_20210201183802.pdf Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

94

artikkel kogumikus

An improved estimation methodology for hybrid BIST cost calculationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 297-300 : ill https://ieeexplore.ieee.org/document/1423882

artikkel kogumikus

95

artikkel kogumikus

Improved VHDL input for high-level synthesis tool xTractorEllervee, Peeter; Ivask, Eero; Kruus, MargusBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 87-90 : ill

artikkel kogumikus

96

artikkel ajakirjas

Insener projekteerib usaldust : [ka TTÜ arvutitehnika instituudi töödest]Ubar, Raimund-JohannesArvutimaailm2011 / 7/8, lk. 8-9 : ill https://artiklid.elnet.ee/record=b2423013*est

artikkel ajakirjas

97

artikkel kogumikus

Integration of high-level synthesis to the courses on reconfigurable digital systemsSklyarov, Valery; Skliarova, Iouliia; Sudnitsõn, Aleksander; Kruus, Margus2015 38th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) : May 25-29, 2015, Opatija, Croatia : proceedings2015 / p. 166-171 : ill http://dx.doi.org/10.1109/MIPRO.2015.7160258

artikkel kogumikus

98

artikkel kogumikus

Internet-based collaborative test generation with MOSCITO [Electronic resource]Schneider, Andre; Ivask, Eero; Miklos, P.; Raik, Jaan; Diener, Karl-Heinz; Ubar, Raimund-Johannes; Cibakova, Tatiana; Gramatova, ElenaSIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 20022002 / [6] p. [CD-ROM] https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF

artikkel kogumikus

99

artikkel kogumikus

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Orasson, Elmet; Wuttke, Heinz-Dietrich23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 659-662 : ill https://ieeexplore.ieee.org/document/1003344

artikkel kogumikus

100

artikkel kogumikus

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Evartson, Teet; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 20022002 / p. 317-320 : ill https://ieeexplore.ieee.org/document/1003344

artikkel kogumikus

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