Otsing - TalTech teadusportaal

kuva

reasta

51

artikkel kogumikus

How to generate high quality tests for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, Jaan2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 22004 / p. 459-462 : ill http://dx.doi.org/10.1109/SMICND.2004.1403048

artikkel kogumikus

52

artikkel kogumikus

Implementation of focused guided waves to locate axial defects in pipesFletcher, Sam; Lowe, Michael John Stewart; Ratassepp, Madis; Brett, C.Review of progress in quantitative nondestructive evaluation. Volume 292010 / p. 223-230 https://doi.org/10.1063/1.3362398

artikkel kogumikus

53

artikkel kogumikus

Influence of point defects on optoelectronic properties of II-IV semiconductorsKukk, Peeter-Enn; Krustok, Jüri; Altosaar, Mare; Aarna, HeitiAbstract booklet of the First International Conference on Mathematical Science of chalcogenide and Diamond-structure Semiconductors, Chernovtsi, 1994. Vol. 11994 / p. 129

artikkel kogumikus

54

artikkel ajakirjas

Interaction between point defects, extended defects and impurities in the Si-SiO2 system during the process of its formationKropman, Daniel; Kärner, T.; Abru, Uno; Ugaste, Ülo; Mellikov, EnnThin solid films2004 / 1/2, p. 53-57 : ill https://www.sciencedirect.com/science/article/abs/pii/S0921510704003459

artikkel ajakirjas

55

artikkel ajakirjas

Interaction between point defects, extended defects and impurities in the Si-SiO2 system during the process of its formationKropman, Daniel; Kärner, T.; Abru, Uno; Ugaste, Ülo; Mellikov, Enn; Kauk, MaritMaterials science and engineering : B2004 / p. 295-298 : ill https://www.sciencedirect.com/science/article/abs/pii/S0921510704003459

artikkel ajakirjas

56

artikkel kogumikus

Investigating defects in digital circuits by Boolean differential equationsKruus, Helena; Orasson, Elmet; Robal, Tarmo; Ubar, Raimund-JohannesThe 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)2004 / p. 432-435

artikkel kogumikus

57

artikkel ajakirjas

Investigation of excess Zn in ZnOLott, Kalju; Volobujeva, Olga; Raukas, Maie; Türn, Leo; Grebennik, A.; Vishnjakov, A.Physica status solidi (c)2003 / 2, Proceedings 10th International Conference on Shallow Level Centers in Semiconductors (SLCS-10) : Warsaw, Poland, 24-27 July 2002, p. 622-625 : ill https://onlinelibrary.wiley.com/doi/abs/10.1002/pssc.200306186

artikkel ajakirjas

58

artikkel kogumikus

Investigation of nickel and copper microfoils defect formation under the stressLeinberg, Silver; Lõhmus, Rünno; Hussainova, Irina; Nisumaa, Reet15th International Baltic Conference "Engineering Materials & Tribology. Baltmattrib - 2006" : October 5-6, 2006, Tallinn, Estonia : abstracts2006 / p. 42-43 : ill

artikkel kogumikus

59

raamat

Investigation of P-i-n GaAs structures by DLTS method : the deep level transient spectroscopy in application to GaAs p-i-n structures for identification of deep levelsToompuu, Jana2010 https://www.amazon.com/Investigation-p-i-n-GaAs-structures-method/dp/383839223X

raamat

60

artikkel ajakirjas

Investigation of potential and compositional fluctuations in CuGa3Se5 crystals using photoluminescence spectroscopyGrossberg, Maarja; Krustok, Jüri; Jagomägi, Andri; Leon, M.; Arushanov, E.; Nateprov, A.; Bodnar, I.Thin solid films2007 / 15, p. 6204-6207 : ill https://www.sciencedirect.com/science/article/pii/S0040609006016221

artikkel ajakirjas

61

artikkel ajakirjas

Investigation of the reconstruction accuracy of guided wave tomography using full waveform inversionRao, Jing; Ratassepp, Madis; Fan, ZhengJournal of sound and vibration2017 / p. 317-328 : ill https://doi.org/10.1016/j.jsv.2017.04.017

artikkel ajakirjas

62

raamat

Keevitus ja külgnevad protsessid. Metallide keevisliidete geomeetriliste defektide liigitusÜksti, Lembit; Laansoo, Andres; Laurfeld, Toomas2004 https://www.ester.ee/record=b1860516*est

raamat

63

raamat

Keevitus ja külgnevad protsessid. Metallide keevisliidete geomeetriliste defektide liigitusLaansoo, Andres2010 https://www.ester.ee/record=b2594992*est

raamat

64

raamat

Keevitus [Võrguteavik] : terase, nikli, titaani ja nende sulamite sulakeevitusliited (välja arvatud kiirguskeevituse meetodid) ; Kvaliteeditasemed keevitusdefektide järgi = Welding : fusion-welding joints in steel, nickel, titanium and their alloys (beam welding excluded) ; Quality levels for imperfections (ISO 5817:2003)2015 http://www.ester.ee/record=b4502650*est

raamat

65

raamat

Keevitus. Terase, nikli, titaani ja nende sulamite sulakeevitusliited (välja arvatud kiirguskeevituse meetodid). Kvaliteeditasemed keevitusdefektide järgi = Welding. Fusion-welded joints in steel, nickel, titanium and their alloys (beam welding excluded). Quality levels for imperfections (ISO 5817:2003)2011 https://www.ester.ee/record=b2652603*est

raamat

66

artikkel ajakirjas

Leakage currents in 4H-SiC JBS diodesIvanov, Pavel; Korolkov, Oleg; Sleptšuk, NataljaSemiconductors2012 / p. 397-400 : ill https://link.springer.com/article/10.1134/S106378261203013X

artikkel ajakirjas

67

artikkel ajakirjas

Low-K factor of SiO2 layer on Si irradiated by YAG:Nd laserMedvid, A.; Onufrijevs, Pavels; Mellikov, Enn; Kropman, Daniel; Muktepavela, F.; Bakradze, G.Journal of non-crystalline solids2007 / p. 703-707 : ill https://www.sciencedirect.com/science/article/pii/S0022309306014116

artikkel ajakirjas

68

artikkel kogumikus

Macro level defect-oriented diagnosability of digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 149-152 : ill

artikkel kogumikus

69

artikkel kogumikus

Mapping physical defects to logic level for defect oriented testingUbar, Raimund-JohannesSCS 2003 : International Symposium on Signals, Circuits and Systems : July 10-11, 2003, Iasi, Romania : proceedings. Vol. 22003 / p. 453-456 : ill https://ieeexplore.ieee.org/document/5731320

artikkel kogumikus

70

artikkel ajakirjas

A method for the calculation of defect equilibriumLott, Kalju; Türn, LeoJournal of crystal growth1999 / p. 493-496: ill

artikkel ajakirjas

71

artikkel ajakirjas

A method for the calculation of defect equilibrium in ZnS:Cu:Al:Bi:ClLott, Kalju; Türn, LeoProceedings of the Estonian Academy of Sciences. Chemistry1996 / p. 130-133 https://www.ester.ee/record=b1072099*est

artikkel ajakirjas

72

artikkel ajakirjas

Modeling of self-localized vibrations and defect formation in solidsHižnjakov, Vladimir; Haas, Mati; Pishtshev, Aleksandr; Šelkan, Aleksander; Klopov, MihhailNuclear instruments and methods in physics research section B-beam interactions with materials and ato2013 / p. 91-94 : ill

artikkel ajakirjas

73

artikkel ajakirjas EST / artikkel ajakirjas ENG

Modeling the effect of anisotropy in ultrasonic-guided wave tomographyRatassepp, Madis; Rao, Jing; Yu, Xudong; Fan, ZhengIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control2022 / p. 330-339 : ill https://doi.org/10.1109/TUFFC.2021.3114432 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

74

dissertatsioon

Modelling construction process impact factors on degradation of thin rendered facades = Ehitusprotsessi mõjufaktorite modelleerimine õhekrohv fassaadide lagunemisel = Methode zur Bewertung der Relevanz von beeinflussenden Faktoren im Bauprozess auf die Mängelfreiheit von WärmedämmverbundsystemenSulakatko, Virgo2019 https://digi.lib.ttu.ee/i/?11575

dissertatsioon

75

artikkel ajakirjas

Module level defect simulation in digital circuitsKuzmicz, Wieslaw; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering2001 / 4, p. 253-268

artikkel ajakirjas

defektid (märksõna)

teaviku laadid

märksõna 2