A decision diagram based hierarchical test pattern generator
autor
Jervan, Gert
Markus, Antti
Raik, Jaan
Ubar, Raimund-Johannes
vastutusandmed
G.Jervan, A.Markus, J.Raik, R.Ubar
allikas
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1998
leheküljed
p. 159-162: ill
ISBN
9985-59-081-3
märkused
Bibl. 5 ref