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artikkel kogumikus

A constraint-driven gate-level test generatorRaik, Jaan; Ubar, Raimund-Johannes; Jervan, Gert; Krupnova, HelenaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 237-240: ill

artikkel kogumikus

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A generic synthesizable NoC switch with a scalable testbenchGovind, Vineeth; Raik, Jaan; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 91-94 : ill

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artikkel ajakirjas

A healthier chip?Ubar, Raimund-Johannes; Fridolin, Ivo; Meigas, Kalju; Min, MartPublic service review : European Union2010 / p. 132-133 : ill

artikkel ajakirjas

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artikkel kogumikus

A hierarchical automatic test pattern generator based on using alternative graphsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 19971997 / p. 415-420

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A hybrid BIST architecture and its optimization for SoC testingJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Kruus, HelenaProceedings of the 3rd International Symposium on Quality Electronic Design : ISQED 2002, March 18-21, 2002, San Jose, California2002 / p. 273-279 : ill

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artikkel kogumikus

A method for crosstalk fault detection in on-chip busesBengtsson, Tomas; Jutman, Artur; Ubar, Raimund-Johannes; Kumar, ShashiNorchip : proceedings : Oulu, Finland, 21-22 November 20052005 / p. 285-288 : ill http://dx.doi.org/10.1109/NORCHP.2005.1597045

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artikkel kogumikus

A new approach to build a low-level malicious fault list starting from high-level description and alternative graphsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza, M.; Ubar, Raimund-JohannesProceedings IEEE European Design & Test Conference, Paris, March 17-20, 19971997 / p. 560-565

artikkel kogumikus

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artikkel kogumikus

A new evolutionary-technique-based approach to optimize pseudo-random TPG for logic BISTJutman, Artur; Aleksejev, Jevgeni; Ubar, Raimund-JohannesMEET/MARIND'2002 : proceedings of First International Congress on Mechanical and Electrical Engineering and Technology and Fourth International Conference on Marine Industry, 07-11 October 2002, Varna Bulgaria. Volume 12002 / p. 247-252 : ill

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artikkel kogumikus

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

artikkel kogumikus

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artikkel ajakirjas

A new testability calculation method to guide RTL test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2005 / 1, p. 71-82 : ill

artikkel ajakirjas

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artikkel kogumikus

A novel artificial neural networks based automatic adaptive fault detection technique for analog circuitsPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 167-170 : ill

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artikkel kogumikus

A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915

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artikkel kogumikus

A PC-based CAD system for training digital testUbar, Raimund-Johannes; Buldas, Ahto; Paomets, Priidu; Raik, Jaan; Tulit, ViljarThe Fifth EUROCHIP Workshop on VLSI Design Training, 17-18-19 October 1994, Dresden, Germany1994 / p. 152-157: ill

artikkel kogumikus

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artikkel kogumikus

A proposal for optimisation of low-powered FSM testingBrik, Marina; Fomina, Jelena; Ubar, Raimund-JohannesProceedings of IEEE East-West Design & Test Workshop (EWDTW'05) : Odessa, Ukraine, September 15-19, 20052005 / p. 15-20

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A scalable static test set compaction method for sequential circuitsAleksejev, Igor; Raik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 87-92 : ill

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A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

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artikkel kogumikus

A set of tools for estimating quality of built-in self-test in digital circuitsJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the International Symposium on Signals, Circuits and Systems, Iasi (Romania), October 2-3, 19971997 / p. 362-365

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artikkel kogumikus

A system for teaching basic and advanced topics of IEEE 1149.1 boundary scan standard (extended abstract)Jutman, Artur; Rosin, Vjatšeslav; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of 16th EAEEIE Conference on Innovation in Education for Electrical and Information Engineering (EIE) : Lappeenranta, Finland, 6th-8th June 20052005 / [2] p. : ill

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artikkel kogumikus

A tool for advanced learning of LFSR-based testing principlesJutman, Artur; Tšertov, Anton; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 175-178 : ill

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artikkel kogumikus

A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 79-82 : ill http://www.ester.ee/record=b2150914*est

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artikkel kogumikus

A tool for teaching hierarchical fault diagnosis in digital circuitsUbar, Raimund-Johannes; Kostin, Sergei; Orasson, Elmet; Evartson, Teet; Brik, MarinaProceedings of 9th European Workshop on Microelectronics Education – EWME’12 : Grenoble, France, May 9-11, 20122012 / p. 1-4

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A tool for teaching pseudo-random TPG principlesJutman, Artur; Tšertov, Anton; Ubar, Raimund-JohannesProceedings of the 17th EAEEIE Annual Conference on Innovation in Education for Electrical and Information Engineering : Craiova, Romania, June 1st-3rd, 20062006 / p. 182-187 : ill

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A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill http://dx.doi.org/10.1109/EWME.2016.7496466

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Aastad, mis möödusid linnulennulUbar, Raimund-JohannesRaimund-Johannes Ubar. Bibliograafia2016 / lk. 13-44 : ill., fot

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About robustness of test patterns regarding multiple faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador2012 / p. 86-91 : ill

artikkel kogumikus

Ubar, Raimund-Johannes (autor)

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