A constraint-driven gate-level test generator
autor
Raik, Jaan
Ubar, Raimund-Johannes
Jervan, Gert
Krupnova, Helena
vastutusandmed
Jaan Raik, Raimund Ubar, Gert Jervan, Helena Krupnova
allikas
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1996
leheküljed
p. 237-240: ill
ISBN
9985-59-026-0
märkused
Bibl. 9 ref