Fault model and test synthesis for RISC-processors
autor
Ubar, Raimund-Johannes
Markus, Antti
Jervan, Gert
Raik, Jaan
vastutusandmed
R.Ubar, A.Markus, G.Jervan, J.Raik
allikas
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1996
leheküljed
p. 229-232: ill
ISBN
9985-59-026-0
märkused
Bibl. 6 ref