prindi

Testing technique for embedded ADC

autor
Zagursky, V.
Gertners, A.
vastutusandmed
V.Zagursky, A.Gertners
allikas
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1998
leheküljed
p. 167-170: ill
ISBN
9985-59-081-3
märkused
Bibl. 6 ref
Zagursky, V., Gertners, A. Testing technique for embedded ADC // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 167-170: ill.