High-level decision diagram simulation for diagnosis and soft-error analysis
author
Raik, Jaan
Repinski, Urmas
Jenihhin, Maksim
Chepurov, Anton
statement of authorship
Jaan Raik, Urmas Repinski, Maksim Jenihhin, Anton Chepurov
source
Design and test technology for dependable systems-on-chip
location of publication
Hershey
publisher
Information Science Reference
year of publication
2011
pages
p. 294-309 : ill
ISBN
978-1-60960-212-3
notes
Bibliogr. p. 307-309
language
inglise