A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs
author
Benso, A.
Prinetto, Paolo
Rebaudengo, M.
Sonza, M.
Ubar, Raimund-Johannes
statement of authorship
A.Benso, P.Prinetto, M.Rebaudengo, M.Sonza, R.Ubar
source
Proceedings IEEE European Design & Test Conference, Paris, March 17-20, 1997
location of publication
[S.l.]
year of publication
1997
pages
p. 560-565
url
https://ieeexplore.ieee.org/document/582417
subject term
rikked
diagnostika (tehnika)
testimine
töökindlus
tarkvara
telekommunikatsioon
language
inglise