DOT: new deterministic defect-oriented ATPG tool
author
Raik, Jaan
Ubar, Raimund-Johannes
Sudbrock, Joachim
Kuzmicz, Wieslaw
Pleskacz, Witold A.
statement of authorship
Jaan Raik, Raimund Ubar, Joachim Sudbrock, Wieslaw Kuzmicz, Witold Pleskacz
source
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
location of publication
Los Alamitos
publisher
IEEE
year of publication
2005
pages
p. 96-101 : ill
ISBN
0-7695-2341-2
notes
Bibliogr.: 10 ref