Probabilistic equivalence checking based on high-level decision diagrams
statement of authorship
Anton Karputkin, Raimund Ubar, Mati Tombak, Jaan Raik
location of publication
[S.l.]
publisher
year of publication
pages
p. 423-428 : ill
conference name, date
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011
conference location
Gottbus, Germany
ISBN
978-1-4244-9753-9
notes
Bibliogr.: 14 ref
language
inglise
Karputkin, A., Ubar, R., Tombak, M., Raik, J. Probabilistic equivalence checking based on high-level decision diagrams // Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany. [S.l.] : IEEE, 2011. p. 423-428 : ill.