Karputkin, A., Ubar, R., Tombak, M., Raik, J.

Probabilistic equivalence checking based on high-level decision diagrams

author

Karputkin, Anton

Ubar, Raimund-Johannes

Tombak, Mati

Raik, Jaan

statement of authorship

Anton Karputkin, Raimund Ubar, Mati Tombak, Jaan Raik

source

Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany

location of publication

[S.l.]

publisher

IEEE

year of publication

2011

pages

p. 423-428 : ill

conference name, date

IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011

conference location

Gottbus, Germany

ISBN

978-1-4244-9753-9

notes

Bibliogr.: 14 ref

language

inglise

Karputkin, A., Ubar, R., Tombak, M., Raik, J. Probabilistic equivalence checking based on high-level decision diagrams // Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany. [S.l.] : IEEE, 2011. p. 423-428 : ill.