Markus, A., Raik, J., Ubar, R. - TalTech Research Portal

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Test set minimization using bipartite graphs

author

Markus, Antti

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

A.Markus, J.Raik, R.Ubar

source

BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1998

pages

p. 175-178: ill

ISBN

9985-59-081-3

notes

Bibl. 9 ref

Markus, A., Raik, J., Ubar, R. Test set minimization using bipartite graphs // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 175-178: ill.