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Fast test pattern generation for sequential circuits using decision diagram representations

author
statement of authorship
Jaan Raik and Raimund Ubar
source
journal volume number month
Vol. 16
year of publication
pages
3, p. 213-226 : ill
url
ISSN
0923-8174
notes
Bibliogr.: 21 ref
language
inglise
Raik, J., Ubar, R. Fast test pattern generation for sequential circuits using decision diagram representations // Journal of electronic testing : theory and applications (JETTA) (2000) Vol. 16, 3, p. 213-226 : ill. https://link.springer.com/article/10.1023/A:1008335130158