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Fast test pattern generation for sequential circuits using decision diagram representations

author
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik and Raimund Ubar
source
Journal of electronic testing : theory and applications (JETTA)
journal volume number month
Vol. 16
year of publication
2000
pages
3, p. 213-226 : ill
url
https://link.springer.com/article/10.1023/A:1008335130158
subject term
elektriahelad
testimine
ISSN
0923-8174
notes
Bibliogr.: 21 ref
language
inglise
Raik, J., Ubar, R. Fast test pattern generation for sequential circuits using decision diagram representations // Journal of electronic testing : theory and applications (JETTA) (2000) Vol. 16, 3, p. 213-226 : ill. https://link.springer.com/article/10.1023/A:1008335130158