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Journal of electronic testing : theory and applications (JETTA) (source)
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journal article
Fast test pattern generation for sequential circuits using decision diagram representations
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2000
/
3, p. 213-226 : ill
https://link.springer.com/article/10.1023/A:1008335130158
journal article
2
journal article
Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits
Jenihhin, Maksim
;
Squillero, Giovanni
;
Tihhomirov, Valentin
;
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 273-289 : ill
http://dx.doi.org/10.1007/s10836-016-5589-x
journal article
3
journal article
Identifying untestable faults in sequential circuits using test path constraints
Viilukas, Taavi
;
Karputkin, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Fujiwara, Hideo
Journal of electronic testing : theory and applications (JETTA)
2012
/
p. 511-521 : ill
journal article
4
journal article
Optimization of boundary scan tests using FPGA-based efficient scan architectures
Aleksejev, Igor
;
Devadze, Sergei
;
Jutman, Artur
;
Shibin, Konstantin
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 245-255 : ill
http://dx.doi.org/10.1007/s10836-016-5588-y
journal article
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courses on electronic testing and design
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inverse problem theory/applications
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inverse problems theory/applications
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