Jenihhin, M., Raik, J., Ubar, R., Tšepurov, A.

full record print

On reusability of verification assertions for testing

author

Jenihhin, Maksim

Raik, Jaan

Ubar, Raimund-Johannes

Tšepurov, Anton

statement of authorship

Maksim Jenihhin, Jaan Raik, Raimund Ubar, Anton Chepurov

source

BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia

location of publication

[Tallinn]

publisher

Tallinn University of Technology

year of publication

2008

pages

p. 151-154 : ill

ISBN

978-1-4244-2059-9

notes

Bibliogr.: 24 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

hinnangud

verifikatsioon

testimine

Jenihhin, M., Raik, J., Ubar, R., Tšepurov, A. On reusability of verification assertions for testing // BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia. [Tallinn] : Tallinn University of Technology, 2008. p. 151-154 : ill.