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Tšepurov, Anton (author)
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1
book article
A scalable model based RTL framework zamiaCAD for static analysis
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
;
Tihhomirov, Valentin
2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC) : October 7-10, 2012 Santa Cruz, USA Dream Inn, Santa Cruz, USA : [proceedings]
2012
/
p. 171-176 : ill
book article
2
journal article
Application of high-level decision diagrams for simulation-based verification tasks
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Estonian journal of engineering
2010
/
1, p. 56-77 : ill
journal article
3
book article
Applications of the open source HW design framework zamiaCAD
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 2012
2012
/
1 p
book article
4
book article
APRICOT : a framework for teaching digital systems verification
Raik, Jaan
;
Jenihhin, Maksim
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
2008
/
p. 172-177 : ill
http://dx.doi.org/10.1109/EAEEIE.2008.4610181
book article
5
book article
Assertion checking with PSL and high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Digest of papers IEEE 8th Workshop on RTL and High Level Testing : WRTLT'07 : October 12-13, 2007, Beijing, China
2007
/
p. 105-110 : ill
https://pld.ttu.ee/~maksim/phd_papers/%5B12%5D%20wrtlt%2707.pdf
book article
6
book article
Assessment of diagnostic test for automated bug localization
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]
2013
/
[6] p. : ill
book article
7
journal article
Automated design error debug using high-level decision diagrams and mutation operators
Raik, Jaan
;
Repinski, Urmas
;
Tšepurov, Anton
;
Hantson, Hanno
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Microprocessors and microsystems
2013
/
p. 505-513 : ill
journal article
8
journal article
Automated design error localization in RTL designs
Jenihhin, Maksim
;
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Raik, Jaan
;
Hantson, Hanno
;
Ubar, Raimund-Johannes
;
Bartsch, Günter
;
Meza Escobar, Jorge Hernan
;
Wuttke, Heinz-Dietrich
IEEE design & test of computers
2014
/
p. 83-92 : ill
http://dx.doi.org/10.1109/MDAT.2013.2271420
journal article
9
book article
Automatic generation of EFSMs and HLDDs for functional ATPG
Tšepurov, Anton
;
Guglielmo, Giuseppe di
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 143-146 : ill
book article
10
book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
11
book article
Code coverage analysis for concurrent programming languages using high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
Proceedings of the 12th European Workshop on Dependable Computing : EWDC 2009 : Toulouse, France, May 14-15, 2009
2009
/
[4] p. : ill
https://hal.archives-ouvertes.fr/hal-00381559
book article
12
book article
Design error diagnosis using backtrace algorithm on decision diagrams
Repinski, Urmas
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
p. 93-96
book article
13
book article
E-learning environment for WEB-based study of testing
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Aleksejev, Igor
;
Tšepurov, Anton
;
Tšertov, Anton
;
Kostin, Sergei
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
Proceedings of the 8th European Workshop on Microelectronics Education : EWME 2010 : Darmstadt, Germany, 10-12 May 2010
2010
/
p. 47-52 : ill
book article
14
book article
Generating directed tests for C programs using RTL ATPG
Raik, Jaan
;
Drenkhan, Tiia
;
Jenihhin, Maksim
;
Viilukas, Taavi
;
Karputkin, Anton
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings of the IEEE 13th Workshop on RTL and High Level Testing (WRTLT'12)
2012
/
p. 1-6
book article
15
dissertation
Hardware modeling for design verification and debug = Riistvara modelleerimine disaini verifitseerimise ja silumise jaoks
Tšepurov, Anton
2013
https://www.ester.ee/record=b2963501*est
dissertation
16
book article
High-Level Decision Diagram manipulations for code coverage analysis
Minakova, Karina
;
Reinsalu, Uljana
;
Tšepurov, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 207-210 : ill
book article
17
book article
High-level decision diagrams based coverage metrics for verification and test
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
2009
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2009.4813792
book article
18
book article
High-level design error diagnosis using backtrace on decision diagrams
Raik, Jaan
;
Repinski, Urmas
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers
2010
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2010.5669486
book article
19
book article
Localization of bugs in processor designs using zamiaCAD framework
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Jenihhin, Maksim
;
Raik, Jaan
13th International Workshop on Microprocessor Test and Verification (MTV 2012) Common Challenges and Solutions : Austin, USA, December 10–12, 2012
2012
/
p. 1-6
https://ieeexplore.ieee.org/document/6519733
book article
20
book article
Mutation analysis with high-level decision diagrams
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
;
Guglielmo, Giuseppe di
;
Fummi, Franco
LATW2010 : 11th Latin-American TestWorkshop, March 28-31, 2010, Punta del Este, Uruguay
2010
/
[6] p. [CD-ROM]
https://ieeexplore.ieee.org/document/5550336
book article
21
book article
On reusability of verification assertions for testing
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Tšepurov, Anton
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 151-154 : ill
book article
22
journal article
PSL assertion checking using temporally extended high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2009
/
6, p. 289-300 : ill
https://pld.ttu.ee/home/maksim/phd_papers/%5B11%5D%20latw%2708.pdf
journal article
23
book article
PSL assertion checking with temporally extended high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 49-54 : ill
https://pld.ttu.ee/~maksim/phd_papers/%5B11%5D%20latw%2708.pdf
book article
24
book article
Simulation-based verification with APRICOT framework using high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
East-West Design & Test Symposium : Moscow, September 18-21, 2009
2009
/
p. 13-16 : ill
book article
25
book article
zamiaCAD : open source platform for advanced hardware design
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2011 University Booth : Design Automation and Test in Europe : Grenoble, France, March 14-18, 2011
2011
/
[2] p.: ill
book article
Number of records 28, displaying
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author
53
1.
Tšepurov, Anton
2.
Aleksejev, Anton
3.
Anisimov, Anton S.
4.
Anton, Arvo
5.
Anton, Christian
6.
Anton, Dea
7.
Anton, E.
8.
Anton, Eha
9.
Anton, Gaspar
10.
Anton, Grete
11.
Anton, H.
12.
Anton, Johan
13.
Anton, K.
14.
Anton, Lauri
15.
Anton, Maia-Liisa
16.
Anton, Mart
17.
Anton, Riina
18.
Anton, Riivo
19.
Arhipov, Anton
20.
Bergant, Anton
21.
Bogdanov, Anton
22.
Charnamord, Anton
23.
Chepurov, Anton
24.
Dijev, Anton
25.
Dmitrijev, Anton
26.
Hansson, Anton
27.
Hromov, Anton
28.
Jürisson, Anton
29.
Karputkin, Anton
30.
Keks, Anton
31.
Kott, Anton
32.
Kurakin, Anton
33.
Kuzmin, Anton V.
34.
Kuznetsov, Anton
35.
Kutser, Anton
36.
Laur, Anton
37.
Malmi, Anton
38.
Mastitski, Anton
39.
Pashkevich, Anton
40.
Potapov, Anton M.
41.
Rassõlkin, Anton
42.
Rutkovski, Anton
43.
Savitš, Anton
44.
Shalygin, Anton S.
45.
Smirnov, Anton
46.
Sokolov, Anton
47.
Terasmaa, Anton
48.
Timofejev, Anton
49.
Trnik, Anton
50.
Tsertov, Anton
51.
Tšertov, Anton
52.
Vedešin, Anton
53.
Verchenko, Anton
CV
21
1.
Anton, Johan
2.
Anton, Mart
3.
Anton, Riina
4.
Arhipov, Anton
5.
Bogdanov, Anton 1916-1960
6.
Jürisson, Anton 1919-2001
7.
Kesküla, Anton
8.
Kutser, Anton
9.
Laur, Anton 1906-1989
10.
Laur, Anton
11.
Pashkevich, Anton
12.
Rassõlkin, Anton
13.
Soans, Anton Lembit 1885-1966
14.
Tammert, Anton 1902-1980
15.
Tammert, Anton Baldwin
16.
Tramberg, Anton
17.
Trampärk, Anton
18.
Tsertov, Anton
19.
Tšertov, Anton
20.
Uesson, Anton 1879-1942
21.
Vedešin, Anton
name of the person
15
1.
Tšepurov, Anton
2.
Anton, Johan
3.
Anton, Maia-Liisa
4.
Anton, Mart, 1979-
5.
Bogdanov, Anton
6.
Karputkin, Anton
7.
Keks, Anton
8.
Rassõlkin, Anton, 1985-
9.
Savitš, Anton
10.
Soans, Anton, 1885-1966
11.
Zeilinger, Anton, 1945-
12.
Tšertov, Anton
13.
Uesson, Anton, 1879-1942
14.
Vedešin, Anton
15.
Üksti, Anton
subject term
1
1.
Anton Heilmann, kaubanduse ja tööstuse aktsiaselts
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