On the reuse of TLM mutation analysis at RTL
author
Guarnieri, Valerio
Hantson, Hanno
Raik, Jaan
Jenihhin, Maksim
Ubar, Raimund-Johannes
statement of authorship
Valerio Guarnieri, ... Hanno Hantson, Jaan Raik, Maksim Jenihhin, Raimund Ubar [et al.]
source
Journal of electronic testing : theory and applications
journal volume number month
Vol. 28, 4
year of publication
2012
pages
p. 435-448 : ill
keyword
mutation analysis
mutation testing
systemC
transaction-level modeling
register-transfer level
ISSN
0923-8174
notes
Bibliogr.: 35 ref
language
inglise