Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
register-transfer level (keyword)
All fields
Source search
Author search
Subject term search
Title search
sõna
starts with
exact match
vabatekst
All fields
Source search
Author search
Subject term search
Title search
sõna
starts with
exact match
vabatekst
—
All fields
Source search
Author search
Subject term search
Title search
sõna
starts with
exact match
vabatekst
—
All fields
Source search
Author search
Subject term search
Title search
sõna
starts with
exact match
vabatekst
—
All fields
Source search
Author search
Subject term search
Title search
sõna
starts with
exact match
vabatekst
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
4
Look more..
(1/221)
Export
export all inquiry results
(4)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Fast RTL fault simulation using decision diagrams and bitwise set operations
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada
2011
/
p. 164-170
https://ieeexplore.ieee.org/document/6104440
book article
2
journal article
Identifying untestable faults in sequential circuits using test path constraints
Viilukas, Taavi
;
Karputkin, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Fujiwara, Hideo
Journal of electronic testing : theory and applications (JETTA)
2012
/
p. 511-521 : ill
https://link.springer.com/article/10.1007/s10836-012-5312-5
journal article
3
journal article
On the reuse of TLM mutation analysis at RTL
Guarnieri, Valerio
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2012
/
p. 435-448 : ill
https://link.springer.com/article/10.1007/s10836-012-5303-6
journal article
4
book article EST
/
book article ENG
SynAssert: automated synthesis of CSCA leakage patterns into cost-effective security assertions
Azarpeyvand, Ali Azarpeyvand
;
Eslami, Mohammad
;
Jervan, Gert
;
Raik, Jaan
;
Ghasempouri, Tara
Proceedings of 2025 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
2025
/
6 p. : ill
https://doi.org/10.1109/ISVLSI65124.2025.11130310
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
221
1.
register-transfer level
2.
Register-Transfer Level (RTL)
3.
Register Transfer Level - RTL
4.
register transfer level modeling decision diagams
5.
register transfer and gate level simulation
6.
gate and register transfer levels
7.
diffusion (mass transfer, heat transfer)
8.
logic level and high level BDDs
9.
Swedish Cancer Register
10.
acoustic transfer impedance
11.
acyl transfer
12.
bidirectional power transfer
13.
capacitive power transfer
14.
cash transfer
15.
charge transfer
16.
compound heat transfer enhancement technique
17.
cross-city model transfer
18.
desined heat transfer coefficient
19.
Ekman transfer
20.
energy transfer
21.
frozen embryo transfer
22.
gene transfer
23.
general theory of information transfer
24.
generic transfer functions
25.
heat- and mass transfer
26.
heat mass transfer
27.
heat transfer
28.
heat transfer coefficient
29.
heat transfer enhancement
30.
heat transfer fluids
31.
implicit fractional transfer function
32.
inductive pover transfer
33.
inductive power transfer
34.
inductive power transfer (IPT)
35.
inductive wireless power transfer link
36.
international knowledge transfer
37.
intramolecular charge transfer
38.
knowledge transfer
39.
knowledge transfer office
40.
mass transfer
41.
methyl transfer
42.
moisture transfer
43.
net transfer capacity
44.
on-device transfer learning
45.
orced convection heat transfer coefficent
46.
phase-transfer catalysis
47.
plasma transfer arc welding
48.
policy transfer
49.
power transfer distribution factor
50.
radiative recombination transfer function
51.
REST (Representational State Transfer)
52.
reverse power transfer
53.
risk transfer
54.
single electron transfer
55.
spectral transfer function
56.
targeted energy transfer (TET)
57.
technology transfer
58.
technology transfer and diffusion
59.
technology transfer network
60.
technology transfer office
61.
technology-transfer processes
62.
technology-transfer processes
63.
transfer
64.
transfer equations
65.
transfer equivalence
66.
transfer function
67.
transfer functions
68.
transfer learning
69.
transfer of knowledge
70.
transport processes/heat transfer
71.
university technology transfer
72.
wireless power transfer
73.
absolute sea level
74.
airport level of service
75.
arousal level
76.
assurance level
77.
behaviour level test generation
78.
bi-level optimization
79.
CO2 level in classrooms
80.
CO2 level in classrooms and kindergartens
81.
confidence level
82.
country-level logistics
83.
Cross-level Modeling of Faults in Digital Systems
84.
customer compatibility level
85.
deep level
86.
deep level traps
87.
determination of the CO2 level
88.
determining the level of creatine
89.
digitalisation level
90.
distribution-level phasor measurement units (D-PMUs)
91.
education level
92.
exposure level
93.
extreme low-water level
94.
extreme penetration level of non synchronous generation
95.
extreme sea-level prediction
96.
extreme water level
97.
gate-level analysis
98.
gate-level circuit abstraction
99.
gate-level netlist
100.
graduate level
101.
Hierarchical Multi-level Test Generation
102.
hierarchical two-level analysis
103.
high level DD (HLDD)
104.
high level of security
105.
high level synthesis
106.
high-level control fault model
107.
high-level control faults
108.
high-level decision diagram
109.
high-level decision diagrams
110.
high-level decision diagrams (HLDD) synthesis
111.
High-level Decision Diagrams for Modeling Digital Systems
112.
high-level expert group on AI
113.
high-level fault coverage
114.
high-level fault model
115.
high-level fault simulation
116.
high-level functional fault model
117.
high-level synthesis
118.
High-Level Synthesis (HLS)
119.
high-level synthesis for test
120.
high-level test data generation
121.
improvement of safety level at enterprises
122.
improvement of safety level at SMEs
123.
initial level of security
124.
lake level
125.
lake-level fluctuations
126.
level control
127.
level crossing
128.
level ice
129.
Level of paranoia
130.
level set
131.
level(s) methodology
132.
level-crossing ADC
133.
level-crossing analog-to-digital converters
134.
level-crossing analogue-to-digital converters (ADC)
135.
logic level
136.
lower trophic level models
137.
low-level
138.
low-level control system transportation
139.
low-level fault redundancy
140.
low-level radiation
141.
Low-level RF EMF
142.
macro-level industry influences
143.
mean sea level
144.
medium level of security
145.
module level power electronics (MLPE)
146.
module-level power electronics (MLPE)
147.
multi level perspective
148.
multi-level governance
149.
multi-level inverter
150.
multi-level leadership
151.
multi-level modeling
152.
multi-level perspective
153.
multi-level perspective of sustainability transitions
154.
multi-level selection and processing environment
155.
noise level
156.
operational level (OL)
157.
Price level
158.
Process/Product Sigma Performance Level (PSPL)
159.
PV module level power electronics
160.
relative sea level
161.
relative sea level changes
162.
relative sea-level change
163.
RH level
164.
school-level policies
165.
sea level
166.
sea level forecasting
167.
sea level prediction
168.
sea level reconstruction
169.
sea level rise
170.
sea level series
171.
sea level trend
172.
sea level: variations and mean
173.
sea-level
174.
sea-level changes
175.
sea-level equation
176.
Sea-level indicator
177.
sea-level prediction
178.
sea-level rise
179.
sea-level trend
180.
Security Level Evaluation
181.
service-level agreements
182.
seven-level multilevel
183.
Sigma performance level
184.
skin conductance level
185.
software level TMR
186.
software security level
187.
steel-level bureaucracy
188.
strategic level decision makers
189.
sufficient level of security
190.
system level
191.
system level hazards
192.
system level simulation
193.
system level test
194.
system planning level
195.
system-level analysis
196.
system-level evaluation
197.
task-level uninterrupted presence
198.
three-level
199.
three-level converter
200.
three-level inverter
201.
three-level neutral-point-clamped inverter
202.
three-level NPC inverter
203.
three-level T-type
204.
three-level T-type inverter
205.
three-level T-type quasi-impedance-source inverter (3L-T-type qZSI)
206.
three-level voltage inverter
207.
Tool Confidence Level
208.
top-level domain
209.
transaction-level modeling
210.
treatment level
211.
two-level inverter
212.
undergraduate level
213.
university level informatics education
214.
water level
215.
water level fluctuation
216.
water level measurements
217.
water level reconstruction
218.
water-level changes
219.
voltage level
220.
voltage level optimisation
221.
3-level T-type inverter
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT