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Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs

author
statement of authorship
Raimund Ubar, Lembit Jürimägi, Elmet Orasson, and Jaan Raik
source
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers
location of publication
[S.l.]
publisher
year of publication
pages
p. 23-45 : ill
series
IFIP advances in information and communication technology ; 483
conference name, date
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference, October 5-7, 2015
conference location
Daejeon, Korea
url
ISSN
1868-4238
ISBN
978-3-319-46096-3
notes
Bibliogr.: 35 ref
Saadaval ka e-raamatuna
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
Ubar, R., Jürimägi, L., Orasson, E., Raik, J. Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs // VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers. [S.l.] : Springer, 2016. p. 23-45 : ill. (IFIP advances in information and communication technology ; 483). https://doi.org/10.1007/978-3-319-46097-0_2