Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs
statement of authorship
Raimund Ubar, Lembit Jürimägi, Elmet Orasson, and Jaan Raik
source
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers
location of publication
[S.l.]
publisher
year of publication
pages
p. 23-45 : ill
series
IFIP advances in information and communication technology ; 483
conference name, date
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference, October 5-7, 2015
conference location
Daejeon, Korea
WOS
kvartiil
category (general)
category (sub)
keyword
ISSN
1868-4238
ISBN
978-3-319-46096-3
notes
Bibliogr.: 35 ref
Saadaval ka e-raamatuna
scientific publication
teaduspublikatsioon
classifier
TTÜ department
language
inglise
Ubar, R., Jürimägi, L., Orasson, E., Raik, J. Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs // VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers. [S.l.] : Springer, 2016. p. 23-45 : ill. (IFIP advances in information and communication technology ; 483).