Distributed approach for genetic test generation in the field of digital electronics
statement of authorship
Eero Ivask, Jaan Raik and Raimund Ubar
source
Intelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 2008
location of publication
[S.l.]
publisher
year of publication
pages
p. 127-136
subject term
ISBN
978-3-540-8525-8
notes
(Studies in computational intelligence ; 162)
language
inglise
Ivask, E., Raik, J., Ubar, R.-J. Distributed approach for genetic test generation in the field of digital electronics // Intelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 2008. [S.l.] : Springer, 2008. p. 127-136.