prindi

Distributed approach for genetic test generation in the field of digital electronics

autor
Ivask, Eero
Raik, Jaan
Ubar, Raimund-Johannes
vastutusandmed
Eero Ivask, Jaan Raik and Raimund Ubar
allikas
Intelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 2008
ilmumiskoht
[S.l.]
kirjastus/väljaandja
Springer
ilmumisaasta
2008
leheküljed
p. 127-136
märksõna
digitaalelektroonika
ISBN
978-3-540-8525-8
märkused
(Studies in computational intelligence ; 162)
keel
inglise
Ivask, E., Raik, J., Ubar, R.-J. Distributed approach for genetic test generation in the field of digital electronics // Intelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 2008. [S.l.] : Springer, 2008. p. 127-136.