RT-level test point insertion for sequential circuits
statement of authorship
Jaan Raik, Vineeth Govind, Raimund Ubar
source
IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings
location of publication
Piscataway
publisher
year of publication
pages
p. 34-40 : ill
conference name, date
IEEE 1st International Workshop on Testability Assessment, November 2, 2004
conference location
Rennes, France
ISBN
0-7803-8851-8
notes
Bibliogr.: 10 ref
language
inglise
Raik, J., Govind, V., Ubar, R.-J. RT-level test point insertion for sequential circuits // IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings. Piscataway : IEEE, 2004. p. 34-40 : ill.