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Automated design error debug using high-level decision diagrams and mutation operators

author
Raik, Jaan
Repinski, Urmas
Tšepurov, Anton
Hantson, Hanno
Ubar, Raimund-Johannes
Jenihhin, Maksim
statement of authorship
Jaan Raik, Urmas Repinski, Anton Chepurov, Hanno Hantson, Raimund Ubar, Maksim Jenihhin
source
Microprocessors and microsystems
publisher
Elsevier
journal volume number month
Vol. 37, 4-5
year of publication
2013
pages
p. 505-513 : ill
conference name, date
28th NORCHIP Conference, November 15-16, 2010
conference location
Tampere, Finland
url
https://doi.org/10.1016/j.micpro.2012.11.004
subject term
integraallülitused
arvuti arhitektuur
vead
otsustusdiagrammid
algoritmid
programmeerimiskeeled
keyword
design errors
debug
mutation operators
high-level decision diagrams
ISSN
0141-9331
notes
Bibliogr.: 29 ref
Special issue on NORCHIP 2012
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
Journal metrics at Scopus
Article at Scopus
WOS
Journal metrics at WOS
Article at WOS
category (general)
Computer science
category (sub)
Computer science. Computer networks and communications
Computer science. Hardware and architecture
Computer science. Software
Computer science. Artificial intelligence
quartile
Q1
TalTech department
arvutitehnika instituut
language
inglise
Raik, J., Repinski, U., Tšepurov, A., Hantson, H., Ubar, R., Jenihhin, M. Automated design error debug using high-level decision diagrams and mutation operators // Microprocessors and microsystems (2013) Vol. 37, 4-5, p. 505-513 : ill. https://doi.org/10.1016/j.micpro.2012.11.004