Algorithms of functional level testability analysis for digital circuits
author
Ubar, Raimund-Johannes
Kuchcinski, Ktzysztof
statement of authorship
R.Ubar, K.Kuchcinski
source
Periodica polytechnica. Electrical engineering
journal volume number month
Vol. 36
year of publication
1992
pages
3/4, p. 295-308
subject term
algoritmid
testimine
digitaalintegraallülitused
language
inglise