High-level path activation technique to speed up sequential circuit test generation
author
statement of authorship
Jaan Raik, Raimund Ubar
source
European Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany
location of publication
Los Alamitos
publisher
year of publication
pages
p. 84-89 : ill
ISBN
0-7695-0390-X
notes
Bibliogr.: 12 ref
language
inglise
Raik, J., Ubar, R. High-level path activation technique to speed up sequential circuit test generation // European Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany. Los Alamitos : IEEE Computer Society Press, 1999. p. 84-89 : ill.