Synthesis of high-level decision diagrams for functional test pattern generation

statement of authorship
Raimund Ubar, Jaan Raik, Anton Karputkin, Mati Tombak
source
Proceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 2009
location of publication
Lodz
year of publication
pages
p. 519-524 : ill
ISBN
978-83-928756-0-4
notes
Bibliogr.: 33 ref
language
inglise
keyword
register transfer level modeling decision diagams
symbolic execution
superposition of graphs
Ubar, R.-J., Raik, J., Karputkin, A., Tombak, M. Synthesis of high-level decision diagrams for functional test pattern generation // Proceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 2009. Lodz : Technical University of Lodz, 2009. p. 519-524 : ill.