About robustness of test patterns regarding multiple faults
author
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
statement of authorship
Raimund Ubar, Sergei Kostin, Jaan Raik
source
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
location of publication
[S.l.]
publisher
IEEE
year of publication
2012
pages
p. 86-91 : ill
conference name, date
LATW 2012: 13th Latin-American Test Workshop, April 10-13, 2012
conference location
Quito, Ecuador
url
https://www.infona.pl/resource/bwmeta1.element.ieee-art-000006261243
subject term
testimine
rikked
arvutitehnika
ISBN
978-1-4673-2356-7
notes
Bibliogr.: 37 ref
language
inglise