Multi-level test generation for digital systems at system, circuit and defect levels
author
statement of authorship
R. Ubar
source
Proceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 2001
location of publication
[Harkov]
publisher
[Harkov University of Technology]
year of publication
pages
p. 286-288
conference name, date
7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing", October 1-4, 2001
conference location
Tuapse, Russia
language
inglise
Ubar, R.-J. Multi-level test generation for digital systems at system, circuit and defect levels // Proceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 2001. [Harkov] : [Harkov University of Technology], 2001. p. 286-288.