Multi-level test generation for digital systems at system, circuit and defect levels
autor
vastutusandmed
R. Ubar
allikas
Proceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 2001
ilmumiskoht
[Harkov]
kirjastus/väljaandja
[Harkov University of Technology]
ilmumisaasta
leheküljed
p. 286-288
konverentsi nimetus, aeg
7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing", October 1-4, 2001
konverentsi toimumispaik
Tuapse, Russia
märksõna
keel
inglise
Ubar, R.-J. Multi-level test generation for digital systems at system, circuit and defect levels // Proceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 2001. [Harkov] : [Harkov University of Technology], 2001. p. 286-288.