Defect-oriented test- and layout-generation for standard-cell ASIC designs
author
Sudbrock, Joachim
Raik, Jaan
Ubar, Raimund-Johannes
Kuzmicz, Wieslaw
Pleskacz, Witold A.
statement of authorship
Joachim Sudbrock, Jaan Raik, Raimund Ubar, Wieslaw Kuzmicz, Witold Pleskacz
source
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
2005
pages
p. 79-82 : ill
ISBN
0-7695-2433-8
notes
Bibliogr.: 11 ref