Parallel exact critical path tracing fault simulation with reduced memory requirements
statement of authorship
Sergei Devadze, Raimund-Johannes Ubar, Jaan Raik, Artur Jutman
source
4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 2009
location of publication
[S.l.]
publisher
year of publication
pages
p. 155-160 : ill
subject term
ISBN
978-1-4244-4321-5
notes
Bibliogr.: 18 ref
language
inglise
Devadze, S., Ubar, R.-J., Raik, J., Jutman, A. Parallel exact critical path tracing fault simulation with reduced memory requirements // 4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 2009. [S.l.] : IEEE, 2009. p. 155-160 : ill.