Turning JTAG inside out for fast extended test access
statement of authorship
Sergei Devadze, Artur Jutman, Igor Aleksejev, Raimund Ubar
location of publication
[S.l.]
publisher
year of publication
pages
[6] p. : ill
ISBN
978-1-4244-4206-5
notes
Bibliogr.: 11 ref
language
inglise
Devadze, S., Jutman, A., Aleksejev, I., Ubar, R.-J. Turning JTAG inside out for fast extended test access // 10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil. [S.l.] : IEEE, 2009. [6] p. : ill.