MLC: a machine learning based checker for soft error detection in embedded processors
author
Nosrati, Nooshin
Jenihhin, Maksim
Navabi, Zainalabedin
statement of authorship
Nosrati, Nooshin; Jenihhin, Maksim; Navabi, Zainalabedin
source
Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
location of publication
New York
publisher
IEEE
year of publication
2022
pages
Code 183305
conference name, date
28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, 2-14 Sept. 2022
conference location
Torino, Italy
url
https://doi.org/10.1109/IOLTS56730.2022.9897309
subject term
tehisõpe
protsessorid
veaavastus
kontrollerid
Scopus
https://www.scopus.com/record/display.uri?eid=2-s2.0-85141422624&origin=resultslist&sort=plf-f&src=s&sid=3b42bc15325c13282d3a40f32ea9fcd1&sot=b&sdt=b&s=TITLE-ABS-KEY%28%22mlc%3A+a+machine+learning+based+checker%22%29&sl=34&sessionSearchId=3b42bc15325c13282d3a40f32ea9fcd1
WOS
https://www.webofscience.com/wos/woscc/full-record/WOS:000865857100012
ISBN
978-166547355-2
notes
Bibliogr.: 25 ref
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems