Enabling cross-layer reliability and functional safety assessment through ML-based compact models
statement of authorship
Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
location of publication
Danvers
publisher
year of publication
pages
6 p. : ill
conference name, date
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), July 13-16, 2020
conference location
Napoli, Italy
ISBN
9781728181875
notes
Bibliogr.: 9 ref
TTÜ department
language
inglise
Alexandrescu, D., Balakrishnan, A., Lange, T., Glorieux, M. Enabling cross-layer reliability and functional safety assessment through ML-based compact models // Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition. Danvers : IEEE, 2020. 6 p. : ill.