prindi

Enabling cross-layer reliability and functional safety assessment through ML-based compact models

autor
Alexandrescu, Dan
Balakrishnan, Aneesh
Lange, Thomas
Glorieux, Maximilien
vastutusandmed
Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
allikas
Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition
ilmumiskoht
Danvers
kirjastus/väljaandja
IEEE
ilmumisaasta
2020
leheküljed
6 p. : ill
konverentsi nimetus, aeg
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), July 13-16, 2020
konverentsi toimumispaik
Napoli, Italy
leitav
https://doi.org/10.1109/IOLTS50870.2020.9159750
märksõna
tehisõpe
rikked
vead
modelleerimine (teadus)
võtmesõna
reliability
functional safety
machine learning
fault models
transient faults
soft errors
ISBN
9781728181875
märkused
Bibliogr.: 9 ref
TTÜ struktuuriüksus
arvutisüsteemide instituut
keel
inglise
Uurimisrühm
Töökindla arvutusriistvara keskus (TARK)
Alexandrescu, D., Balakrishnan, A., Lange, T., Glorieux, M. Enabling cross-layer reliability and functional safety assessment through ML-based compact models // Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition. Danvers : IEEE, 2020. 6 p. : ill. https://doi.org/10.1109/IOLTS50870.2020.9159750