Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuits
author
statement of authorship
Maksim Jenihhin
source
1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania
location of publication
[Cluj-Napoca]
publisher
Technical University of Cluj-Napoca
year of publication
pages
[1] p
conference name, date
1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems, May 28-29, 2015
conference location
Cluj-Napoca, Romania
subject term
TTÜ department
language
inglise
Jenihhin, M. Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuits // 1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania. [Cluj-Napoca] : Technical University of Cluj-Napoca, 2015. [1] p.