prindi

Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuits

autor
Jenihhin, Maksim
vastutusandmed
Maksim Jenihhin
allikas
1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania
ilmumiskoht
[Cluj-Napoca]
kirjastus/väljaandja
Technical University of Cluj-Napoca
ilmumisaasta
2015
leheküljed
[1] p
konverentsi nimetus, aeg
1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems, May 28-29, 2015
konverentsi toimumispaik
Cluj-Napoca, Romania
märksõna
elektronlülitused
loogikaelemendid
diagnostika (tehnika)
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Jenihhin, M. Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuits // 1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania. [Cluj-Napoca] : Technical University of Cluj-Napoca, 2015. [1] p.