Combining functional and structural approaches in test generation for digital systems
author
Ubar, Raimund-Johannes
statement of authorship
Raimund Ubar
source
Microelectronics reliability
publisher
Elsevier
journal volume number month
Vol. 38, 3
year of publication
1998
pages
p. 317-329 : ill
url
https://doi.org/10.1016/S0026-2714(97)00192-3
subject term
digitaaltehnika
testimine
testid
notes
Bibliogr.: 33 ref
TalTech department
arvutisüsteemide instituut
language
inglise