Combining functional and structural approaches in test generation for digital systems
author
Ubar, Raimund-Johannes
statement of authorship
Raimund Ubar
source
Microelectronics reliability
journal volume number month
Vol. 38
year of publication
1998
pages
3, p. 317-329 : ill
subject term
digitaaltehnika
testimine
testid
notes
Bibliogr.: 33 ref
language
inglise