print

The class of test signals for dynamic testing of AD converters

author
Land, Raul
statement of authorship
R.Land
source
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
location of publication
[Tallinn]
publisher
Tallinn Technical University
year of publication
2000
pages
p. 127-128 : ill
ISBN
9985-59-179-8
notes
Bibliogr.: 3 ref
Land, R. The class of test signals for dynamic testing of AD converters // The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings. [Tallinn] : Tallinn Technical University, 2000. p. 127-128 : ill.