prindi

The class of test signals for dynamic testing of AD converters

autor
Land, Raul
vastutusandmed
R.Land
allikas
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
ilmumiskoht
[Tallinn]
kirjastus/väljaandja
Tallinn Technical University
ilmumisaasta
2000
leheküljed
p. 127-128 : ill
ISBN
9985-59-179-8
märkused
Bibliogr.: 3 ref
Land, R. The class of test signals for dynamic testing of AD converters // The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings. [Tallinn] : Tallinn Technical University, 2000. p. 127-128 : ill.