SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logic
author
Kostin, Sergei
Raik, Jaan
Ubar, Raimund-Johannes
Jenihhin, Maksim
statement of authorship
Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, ... [et al.]
source
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
2015
pages
p. 223-228 : ill
conference name, date
18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015, 22-24 April, 2015
conference location
Belgrade, Serbia
subject term
elektronlülitused
elutsüklid (tehnika)
kompuutermodelleerimine
keyword
Negative Bias Temperature Instability (NBTI)
NBTI-induced path delay estimation
static timing analysis
predictive model
aging
logic circuit
ISBN
978-1-4799-6780-3
notes
Bibliogr.: 14 ref
TalTech department
arvutitehnika instituut
language
inglise