Functional test generation for finite state machines
author
Ubar, Raimund-Johannes
Brik, Marina
Jutman, Artur
Raik, Jaan
Bengtsson, Tomas
Kumar, Shashi
statement of authorship
R.Ubar, M.Brik, A.Jutman, J.Raik, T.Bengtsson, S.Kumar
source
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
location of publication
[Tallinn]
publisher
Tallinn University of Technology
year of publication
2006
pages
p. 205-208 : ill
subject term
testimine
VLSI-ahelad
ISBN
1-4244-0414-2
notes
Bibliogr.: 16 ref
language
inglise