Fast fault emulation for synchronous sequential circuits
statement of authorship
J. Raik, P. Ellervee, V. Tihhomirov, R. Ubar
location of publication
[Kharkov]
year of publication
pages
p. 35-40
conference name, date
2nd East–West Design & Test Workshop, September 23-26, 2004
conference location
Yalta, Alushta, Crimea, Ukraine
ISBN
966-659-088-3
language
inglise
subject term
Raik, J., Ellervee, P., Tihhomirov, V., Ubar, R.-J. Fast fault emulation for synchronous sequential circuits // Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004. [Kharkov], 2004. p. 35-40.